Energy weighted x-ray dark-field imaging

Pelzer, Georg; Zang, Andrea; Anton, G.; Bayer, Florian; Horn, Florian; Kraus, M.; Rieger, Jens; Ritter, André; Wandner, Johannes; Weber, Thomas; Fauler, A.; Fiederle, M.; Wong, Winnie; Campbell, M.; Meiser, Jan; Meyer, Pascal; Mohr, Jürgen; Michel, Thilo

doi:10.1364/oe.22.024507

Cited by 13 publications

(4 citation statements)

References 30 publications

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“…Spectral detectors have been used for phase-contrast measurements to increase image contrast for both radiography and computed tomography interrogation. [7][8][9][10] Others have determined that there is a particle-size selectivity in gratings-based dark field measurements, and experimental data acquired at a synchrotron photon source have validated this theory. 11 This particle-size selectivity is an additional signature that can help to determine physical characteristics of a sample and may help discriminate between materials that could not otherwise be differentiated with other measurement methods.…”

Section: Introductionmentioning

confidence: 94%

Spectral gratings-based phase-contrast imaging for materials characterization

Gilbert,

Denny,

Sarceno

et al. 2023

Anomaly Detection and Imaging With X-Rays (ADIX) VIII

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Spectral X-ray detectors provide a direct observation of the energy spectrum of a transmitted X-ray beam, both for typical and phase-contrast gratings-based systems. The sensitivity of a gratings-based X-ray system to small-angle deflections from a given particle size is dependent on X-ray energy. Therefore, spectral (energy-sensitive) detectors could be sensitive to particle size, even with a broad spectrum from a commercial X-ray generator. Furthermore, these detectors allow direct observation of how the X-ray spectrum is changing as the beam is passing through an object and gratings, and how this affects grating visibilities used to determine the presence of small-angle deflections. This is a particular issue for higher-energy systems where artifacts from beam hardening are common. We present results exploring the particle-size dependent signatures that are available from a spectral gratings-based phase-contrast X-ray imaging system, and the feasibility of observing them with lab-based, broad-spectrum X-ray generators.

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Section: Introductionmentioning

confidence: 94%

Spectral gratings-based phase-contrast imaging for materials characterization

Gilbert,

Denny,

Sarceno

et al. 2023

Anomaly Detection and Imaging With X-Rays (ADIX) VIII

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“…They are able to access information not only about the attenuation properties of the observed object, but also of phase and scattering properties. Thus, information about the sample’s microstructure and refractive properties, related to ultra-small-angle X-ray scattering, can be accessed 5 , 6 . Furthermore, previous studies have demonstrated a relation between the scattering signal and the size of structural features for the prior mentioned imaging modalities 7 , 8 .…”

Section: Introductionmentioning

confidence: 99%

Grating-based spectral X-ray dark-field imaging for correlation with structural size measures

Taphorn

Marco

Andrejewski

et al. 2020

Sci Rep

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X-ray dark-field (XDF) imaging accesses information on the small-angle scattering properties of the sample. With grating interferometry, the measured scattering signal is related to the sample's autocorrelation function, which was previously demonstrated for simple samples, such as monodispersed microspheres for which the autocorrelation function is mathematically given. However, in potential clinical applications of XDF imaging, complex microstructures, such as lung parenchyma are under investigation. Their bahaviour in XDF imaging is not yet known and no mathematical description of the autocorrelation function is derived so far. In this work we demonstrate the previously established correlation of the XDF data of complex sample structures with their autocorrelation function to be impractical. Furthermore, we propose an applicable correlation between XDF and the sample's structural parameter on the basis of mean chord length, a medicallyapproved measure for alveolar structure, known to be affected by structural lung diseases. Our findings reveal a correlation between energy-dependent XDF imaging and the sample's mean chord length. By that, a connection between a medical measure for alveoli and XDF is achieved, which is particularly important regarding potential future XDF lung imaging applications for the assessment of alveoli size in diagnostic lung imaging.

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“…While some papers [15][16][17] have recently reported the demonstration of the combination of the multi-wavelength method and the Talbot-Lau interferometer mainly for visibility-contrast imaging, we focus on the phase imaging in this paper and take thorough advantage of the multi-wavelength with TOF technique at a pulsed neutron source. We report the demonstration of Talbot-Lau interferometry with TOF method and the wavelength-resolved analysis for highly precise and accurate differential-phasecontrast imaging.…”

mentioning

confidence: 99%

Efficient phase imaging using wavelength-resolved neutron Talbot-Lau interferometry with TOF method

Seki

Shinohara

Parker

et al. 2018

EPL

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For efficient differential-phase-contrast imaging, we have demonstrated the wavelength-resolved neutron Talbot-Lau interferometry with the wavelength resolution of 0.11 Å over a wide wavelength range of 2.5-7.5 Å at RADEN in the J-PARC Materials and Life Science Experimental Facility. The time-of-flight measurement has clearly showed that the visibility of moiré fringes and intensity oscillations of the interferometer varied continuously with the wavelength, and the wavelength dependence of the differential phase of metal samples was measured. Based on the analysis utilizing this wavelength dependence, we achieved both high statistical precision and high accuracy in the differential-phase-contrast imaging, and succeeded in the quantitative evaluation of the optical potentials of metals.

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Energy weighted x-ray dark-field imaging

Cited by 13 publications

References 30 publications

Spectral gratings-based phase-contrast imaging for materials characterization

Spectral gratings-based phase-contrast imaging for materials characterization

Grating-based spectral X-ray dark-field imaging for correlation with structural size measures

Efficient phase imaging using wavelength-resolved neutron Talbot-Lau interferometry with TOF method

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