2021
DOI: 10.1016/j.actamat.2021.117403
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Energy-storage-efficient 0.9Pb(Mg1/3Nb2/3)O3–0.1PbTiO3 thick films integrated directly onto stainless steel

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Cited by 21 publications
(20 citation statements)
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“…On the contrary, the almost constant hardness for the film before/after annealing indicates the dislocation activities are absent in these samples, and the plastic deformation is most likely mediated by grain boundary sliding as well as the plastic flow of the amorphous phases, 72 as will be discussed later. The hardness of ∼8 GPa was obtained in AD‐BT films before annealing, in good agreement with the previous reported value (∼5 GPa) for AD‐BT films in the literature 24 …”
Section: Resultssupporting
confidence: 92%
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“…On the contrary, the almost constant hardness for the film before/after annealing indicates the dislocation activities are absent in these samples, and the plastic deformation is most likely mediated by grain boundary sliding as well as the plastic flow of the amorphous phases, 72 as will be discussed later. The hardness of ∼8 GPa was obtained in AD‐BT films before annealing, in good agreement with the previous reported value (∼5 GPa) for AD‐BT films in the literature 24 …”
Section: Resultssupporting
confidence: 92%
“…The hardness of ∼8 GPa was obtained in AD-BT films before annealing, in good agreement with the previous reported value (∼5 GPa) for AD-BT films in the literature. 24 To gain insight into microstructures of these samples after nanoindentation tests, we undertook topographic and PFM analysis of the sample surfaces. No apparent cracks around the residual impressions were found in topography images of AD-BT thick films before (Figure 6A) and after annealing (Figure 6C).…”
Section: Nanoindentation Testsmentioning
confidence: 99%
“…As we have seen in the SEM analysis (figures 1(e)-(j)), the microstructure is preserved after annealing the films. Therefore, one of the possible reasons for the changes in P-E behavior after annealing is related to stress relaxation, as previously shown for PMN-10PT thick films on SS [26]. Dielectric breakdown strength (DBS) was evaluated using Weibull analysis (supplementary material S5).…”
Section: Resultsmentioning
confidence: 99%
“…Diffraction patterns were recorded in the Bragg-Brentano geometry using a 100-channel X'Celerator detector in a 2θ range of 10 • -120 • with a step of 0.017 • and an integration time of 100 s per step. For the Rietveld refinement, the Topas R package (version 2.1, Bruker AXS GmbH, Germany) was employed as described elsewhere [26]. According to the literature, a tetragonal (P4mm) and a monoclinic (Pm) crystal structure co-exist in the PMN-35PT solid solution [2,3].…”
Section: Methodsmentioning
confidence: 99%
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