Energy-dispersive X-ray diffraction studies of the texture in cold-rolled alpha-beta brass

Szpunar, Jerzy A.; Gerward, L.

doi:10.1007/bf02396797

Cited by 9 publications

(8 citation statements)

References 6 publications

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“…The correction problems were discussed earlier. 7,11 When measuring texture using neutron diffraction, we have to consider extinction corrections.…”

Section: Discussionmentioning

confidence: 99%

Geometry of Texture Measurements for Dispersive Methods

Szpunar

1981

Texture, Stress, and Microstructure

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The application of energy-dispersive neutron and X-ray methods in texture studies is briefly reviewed and discussed. New geometries of texture measurement using energy-dispersive methods with stationary counters and specimen are suggested. Depending on the number of counters the experimental data can be sufficient for the orientation distribution function (ODF) or the ideal orientations determination. Coarse-grained materials can be studied not only by neutron diffraction but also by using the energy-dispersive X-ray method. Studies of texture changes under the influence of temperature, time and external stresses can also be conducted conveniently. The ener.gy-dispersive X-ray method may readily be adapted to industrial texture control.

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“…The correction problems were discussed earlier. 7,11 When measuring texture using neutron diffraction, we have to consider extinction corrections.…”

Section: Discussionmentioning

confidence: 99%

Geometry of Texture Measurements for Dispersive Methods

Szpunar

1981

Texture, Stress, and Microstructure

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“…For large-slit apertures in the primary and the diffracted beam, which are used in conventional XSA experiments, the shaping function w x, y, z, u, c, h ð Þ can be neglected. In this case the information depth only depends on the absorption factor and equation (5) takes the form hzi = t = 1/mk, which is called the 1/e information depth. On the other hand, if narrow slits are used to define a very small sampling volume for high-resolution strain [23] or stress [24] scanning experiments in the real space, the absorption within the GV is usually neglected and the information depth is then given by the position of its geometrical centroid below the surface.…”

Section: Ementioning

confidence: 99%

“…The distance between the sample and the stage is 1600 mm and the point (0,0) coincides with the position where the primary beam would hit the stage. The three diffraction angles 2u 0 of 5°, 7.4°, and 10°chosen for the calculations correspond to vertical distances (0, z) from the primary beam of z = 140 mm, 208 mm, and 282 mm, respectively is assigned to the centroid position hzi of the gauge volume according to equation (5). The principle of this stress scanning method [24] may be understood by means of Fig.…”

Section: Application Of the Two-detectormentioning

confidence: 99%

“…Perhaps the most striking advantage of ED diffraction on polycrystalline materials compared with angle-dispersive (AD) diffraction is the fact that it allows the detection of complete diffraction patterns under fixed but arbitrary scattering directions, 2u. Therefore it is not surprising that the initial focus of ED diffraction experiments was on research fields in physics, chemistry, and materials sciences, which require a multitude of diffraction lines E hkl such as crystal structure determination [4], texture [5] and line profile analysis [6], or quantitative phase analysis [7]. Also experiments using complex sample environments like high-pressure cells, where the angular range for observing the diffracted beam is strongly limited by the apparatus used for sample processing, were reported in the early days of ED diffraction [8].…”

Section: Introductionmentioning

confidence: 99%

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Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis

Genzel

Denks

Coelho

et al. 2011

The Journal of Strain Analysis for Engineering Design

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Responding to a growing interest from the materials science community for residual stress, texture, and microstructure analysis, strong efforts are made to enhance existing and develop novel methods that allow for fast in-situ studies at elevated temperature, measurements under external load, or residual strain, and stress scanning with high spatial resolution. In the paper, energy-dispersive diffraction using high-energy white synchrotron radiation is shown to provide some distinct advantages concerning residual stress and texture analysis, which mainly arise from the fact that the energy-dispersive diffraction mode allows for the measurement of complete diffraction patterns under fixed but arbitrary scattering angles, 2u. A new two-detector setup for simultaneous in-and out-of-plane diffraction analysis, which has been put into operation recently at the energy-dispersive materials science beamline EDDI at BESSY II, is introduced by using the examples of real-space residual stress and texture depth profiling on mechanically treated polycrystalline materials as well as of the in-situ study of (residual) stress evolution in a thin film at elevated temperature. It will be demonstrated that the individual measuring problems require the application of different geometrical slit configurations to define the pathways of the diffracted beams.

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“…For example, if the mean texture is sufficient for the prediction of the anisotropy, the use of high-energy X-ray [5] or neutron diffraction [6] is recommended because these techniques provide iniormation about the mean texture. If, however, for an estimation of the material's magnetic anisotropy, the through-thickness inhomogeneity of texture must be known, an X-ray method, which provides the most suitable information, would be necessary.…”

Section: Introductionmentioning

confidence: 99%

The effect of textural through-thickness inhomogeneity on the prediction of the anisotropy of magnetocrystalline energy in silicon steels

Blandford

Szpunar

1991

IEEE Trans. Magn.

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Silicon steel specimens were used in a study of the textural through-thickness inhomogeneity and its effect on the correlation of the texture with the anisotropy of the magnetic properties. For this study, the texture was measured as a function of the depth below the sheet surface for three specimens taken one each after the first cold rolling stage, the intermediate anneal and the subsequent second cold rolling stage of the processing of grain-oriented silicon steel (3% silicon). Using a well-tested correlation between the texture and the magnetic anisotropy [1]-[4], attempts were made to fit the Fourier coefficients of torque predictions made from the textures of various sheet layers to the corresponding Fourier coefficients obtained from bulk magnetic torque measurements. It was found that the best fit was obtained by volume-fraction weighting of the predictions from various layers.

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Energy-dispersive X-ray diffraction studies of the texture in cold-rolled alpha-beta brass

Cited by 9 publications

References 6 publications

Geometry of Texture Measurements for Dispersive Methods

Geometry of Texture Measurements for Dispersive Methods

Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis

The effect of textural through-thickness inhomogeneity on the prediction of the anisotropy of magnetocrystalline energy in silicon steels

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