Energy and Disturbance Analysis of 1T-DRAM With Nanowire Gate-All-Around RFET

Nirala, Rohit Kumar; Semwal, Sandeep; Gupta, Manish; Kranti, Abhinav

doi:10.1109/ted.2024.3371950

IEEE Trans. Electron Devices

2024

DOI: 10.1109/ted.2024.3371950

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Energy and Disturbance Analysis of 1T-DRAM With Nanowire Gate-All-Around RFET

Rohit Kumar Nirala,

Sandeep Semwal,

Manish Gupta

et al.

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Energy and Disturbance Analysis of 1T-DRAM With Nanowire Gate-All-Around RFET

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