Enabling ECC and Repair Features in an eFuse Box for Memory Repair Applications

Costa, Miguel; Beerla, Srikanth

doi:10.1109/isqed51717.2021.9424327

2021 22nd International Symposium on Quality Electronic Design (ISQED) 2021

DOI: 10.1109/isqed51717.2021.9424327

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Enabling ECC and Repair Features in an eFuse Box for Memory Repair Applications

Miguel Costa

Srikanth Beerla

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Enabling ECC and Repair Features in an eFuse Box for Memory Repair Applications

Cited by 1 publication

References 5 publications

A March 5n FSM-Based Memory Built-In Self-Test (MBIST) Architecture with Diagnosis Capabilities

A March 5n FSM-Based Memory Built-In Self-Test (MBIST) Architecture with Diagnosis Capabilities

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