Empirical, Semi-Empirical and Experimental Determination of K X-Ray Fluorescence Parameters of Some Elements in the Atomic Range 21 ≤ Z ≤ 30

Abstract

In this study, the semi-empirical and empirical calculations of K X-ray intensity ratios, K-shell fluorescence yields, and vacancy transfer probabilities have been performed for 3d transition elements. Also, r Ka , r Kb production cross-sections, K b =K a intensity ratios, x K fluorescence yields, and g KL vacancy transfer probabilities of 3d transition elements have been measured. The samples were excited by 59.5 keV c-rays from a 241 Am annular radioactive source. K X-rays emitted by samples were counted by an Ultra-LEGe detector with a resolution of 150 eV at 5.9 keV.

FLUKA Simulations of Kβ/Kα Intensity Ratios of Copper in Ag–Cu Alloys

“…However, the results obtained for X-ray tube [38,43,45,46], Kelectron capture [43], protons (1 MeV, 2 MeV) [44], synchrotron radiation (10 keV) [47] and high-energy electron beam [53] are also available. The Cu-Kβ/Kα values were obtained by use of Si(Li) [16,24,26,28-33, 35,37-41,43-45,47,48,50], Ge [23,25,27,34,36,42,51,52] and high-resolution double-crystal X-ray spectrometer with a proportional counter Si(220) [46]. In our study, we utilized FLUKA simulations to obtain data, which are presented in Figure 4 alongside values from existing literature.…”

The Semi-Empirical Determination of K X-ray, KLL Auger Line and L subshell level widths for 3d transition elements at 59.5 keV

“…First, K shell fluorescence yields were determined using Eq. 2.4 and the measurements were repeated at 59.5 keV which were different from our previous study [15]. Using the ratio of the total radiative transition rates and K shell fluorescence yield values (Eq.…”

“…Pure samples were irradiated by 241 Am annular radioactive source at 59.5 keV. The experimental set-up was arranged as in our previous paper [15] but the measurements were repeated to obtain new updated photo-peaks. The obtained photopeaks were used for determining the K X-ray production cross-sections and other fluorescence parameters.…”

“…The self-absorption correction factors for elements were determined with the same relation as explained in our previous study [15]. The detection efficiency of EDXRF system means to the ratio of the number of particles detected per unit time to the number of particles impinging upon the detector per unit time.…”

“…In this relation, Γ values are the obtained values in this study. The experimental procedures are the same as in our previous study [15] and the measurements are repeated again at 59.5 keV using Ultra LEGe to obtain new updated semi-empirical values.…”