2007
DOI: 10.1109/ted.2007.894610
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Emitter Formation and Contact Realization by Diffusion for Germanium Photovoltaic Devices

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Cited by 83 publications
(60 citation statements)
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“…Temperature was increased to 120 ˚C with 10 ˚C/min ramping rate, which was slow enough to prevent SOD film cracking. 8) However, this film was highly non-uniform as confirmed by optical microscopy. The nonuniformity is clearly identified as line-shaped wrinkles corresponding to variations in film thickness.…”
Section: Process Optimizationmentioning
confidence: 86%
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“…Temperature was increased to 120 ˚C with 10 ˚C/min ramping rate, which was slow enough to prevent SOD film cracking. 8) However, this film was highly non-uniform as confirmed by optical microscopy. The nonuniformity is clearly identified as line-shaped wrinkles corresponding to variations in film thickness.…”
Section: Process Optimizationmentioning
confidence: 86%
“…This concentration exceeds the solid solubility of P in Ge, which should be enough to achieve a high active-carrier concentration with a uniform doping profile across the whole Ge thickness. 8) The main difference between the two dopant sources is the solvent, group A is a water-based solution of a polymer contatining P, while group B is alcohol-based (ethanol) solution containing P. This affects the solution properties such as viscosity, which is crucial for spin-coating. According to data from suppliers, viscosity (at 25 ˚C) of the group A dopant source is 7 cP, while it is between 0.80 -1.2 cP for group B dopant.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…Common problems that would arise are such as dopant spreading in the oxide layer, thickness variation especially during the early stages and cost related to additional processes such as etching and annealing (Zant, 2000). The SOD technique have been used to produce the p+ and n+ wells in silicon substrates (Gangopadhyay et al 2003;Oh et al 2004), n+ wells in germanium layers (Posthuma et al 2007) as well as the p+ and n+ wells in GaAs substrates (Filmtronics, 2006a;Filmtronics, 2006b). In addition, the SOD diffusion technique was used previously in the development of a silicon-based lateral p-i-n photodiode in our laboratory (Ehsan & Shaari, 2001;Menon, 2005).…”
Section: Spin-on Chemical Fabrication Methods Of Ingaas/inp-based Ilppmentioning
confidence: 99%
“…All other calculations for the bottom cell are the same. The properties of the bottom cells reported are based on the best performing bottom cells produced by other groups for mechanical stacked solar cells [17], [19], [20] while the top GaAs solar cell is based on those being produced within the Tyndall National Institute. The material properties used are given in Table 1.…”
Section: B) Absorption Modellingmentioning
confidence: 99%