1984
DOI: 10.1103/physrevlett.53.2165
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Emission of Band-Gap-Energy Positrons from Surfaces of LiF, NaF, and Other Ionic Crystals

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Cited by 47 publications
(9 citation statements)
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“…Unfortunately, contrary to Ref. 9, it now does not appear that ionic crystals would make very good moderators for muons, 16 although solid Ne could possibly give a useful slow-muon yield. On the other hand, the large yield of reemitted positrons and their long diffusion length suggests that the rare gases will be excellent slow-positron moderators.…”
Section: Armentioning
confidence: 63%
“…Unfortunately, contrary to Ref. 9, it now does not appear that ionic crystals would make very good moderators for muons, 16 although solid Ne could possibly give a useful slow-muon yield. On the other hand, the large yield of reemitted positrons and their long diffusion length suggests that the rare gases will be excellent slow-positron moderators.…”
Section: Armentioning
confidence: 63%
“…Incident beams of positrons have been used to study Ps diffusion in crystalline and amorphous ice (Eldrup et al y 1983(Eldrup et al y , 1984(Eldrup et al y , 1985, in a variety of ionic solids (Mills and Crane, 1984), and on oriented crystals of quartz , all of which are summarized in Table VII. The diffusion coefficients are all small (on the order of 0.1 cmVsec or less).…”
Section: Psmentioning
confidence: 99%
“…b Sferlazzo, Berko, and Canter, 1987. c Dupasquier, 1984 Sferlazzo, Berko, and Canter, 1985. e Paulin, 1968, 1972. f Kakimoto, Hyodo, and Fujiwara, 1985. g Mills and Crane, 1984. h Boev and Arefiev, 1985.…”
Section: Psmentioning
confidence: 99%
“…The following processes to form Ps at the surface have been reported in the literature: (a) implanted positrons can diffuse to the surface, capture an electron and leave as Ps, 2 (b) implanted positrons can get trapped into a surface state that can be thermally activated into Ps emission, 3 and (c) Ps can be formed in the bulk of the material and can diffuse back to the surface where it is emitted. [4][5][6] Time-Of-Flight (TOF) spectroscopy is the most accurate method to measure the energy distribution of emitted orthopositronium (oPs) in a direct way. Sferlazzo 3,6 used this method to study oPs emission from Al, MgO and ␣-SiO 2 surfaces.…”
mentioning
confidence: 99%