2015
DOI: 10.1109/tpel.2014.2340404
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EMI Generation Characteristics of SiC and Si Diodes: Influence of Reverse-Recovery Characteristics

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Cited by 55 publications
(17 citation statements)
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“…At the time of Vds rising to Vdc, V * gs will reach the maximum value V * gs_max which can be taken as the spurious gate voltage. This time can be calculated by (3). Afterwards, the spurious gate voltage V * gs_max at this time can be obtained from (2).…”
Section: B Gate Drive Pulse Used For Double Pulse Testmentioning
confidence: 99%
See 1 more Smart Citation
“…At the time of Vds rising to Vdc, V * gs will reach the maximum value V * gs_max which can be taken as the spurious gate voltage. This time can be calculated by (3). Afterwards, the spurious gate voltage V * gs_max at this time can be obtained from (2).…”
Section: B Gate Drive Pulse Used For Double Pulse Testmentioning
confidence: 99%
“…the parasitic inductance of printed circuit board (PCB) traces and the parasitic capacitance of switching devices [2]. The high dv/dt and di/dt during the fast switching transient will bring serious electromagnetic interference (EMI) problem [3]. And the high dv/dt can intensify the interaction between the two complementary SiC MOSFETs of the same phase leg (crosstalk [4]).…”
Section: Introductionmentioning
confidence: 99%
“…High dv/dt caused by the high switching speed can intensify the interaction between the two complementary SiC MOSFETs of the same phase leg (crosstalk [4]), inducing spurious gate voltage which may lead to the shoot-through failure of the converters. Besides, the high dv/dt and di/dt will bring more serious electromagnetic interference (EMI) problem [5]. Another issue for the adoption of SiC MOSFETs is that, the intrinsic body diode of the SiC MOSFET tends to have relatively higher forward voltage drops and larger reverse-recovery losses compared to the purpose-designed diode.…”
Section: Introductionmentioning
confidence: 99%
“…A major concern in synchronous dc-dc converters is the reverse recovery effect of the synchronous transistor's antiparallel body diode at the instant of turning on the main transistor T (mainFET). For the duration of the reverse recovery phenomena, both transistors are exposed to high current change rates and high peak reverse recovery currents which significantly increase switching losses, cause electromagnetic interference, and lead to dangerous operating conditions [8]- [10]. Another drawback of hard-switched converters that utilize synchronous rectification is the unwanted Cdv/dt-induced turn-on of the synchronous transistor (syncFET) immediately after its body diode recovers [11], [12].…”
Section: Introductionmentioning
confidence: 99%