2011
DOI: 10.1002/adma.201102726
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Emeraldicene as an Acceptor Moiety: Balanced‐Mobility, Ambipolar, Organic Thin‐Film Transistors

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Cited by 104 publications
(51 citation statements)
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References 35 publications
(21 reference statements)
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“…The AFM height images show that the surface root-mean-square (RMS) roughness for PTZ-CN, PTZO-CN and PTZDO-CN is 0.579 nm, 1.975 nm and 4.82 nm, respectively, which become increasingly rougher as the sulphur oxidation state increases. 16 Therefore, the ON/OFF current ratio of the device based on PTZO-CN is high, and the device is in its low-conductivity state ("0" state) at low voltage (Fig. Moreover, a smoother morphology may also prevent the aluminum (Al) from penetrating into the organic lm during the vacuum deposition of the aluminum electrode.…”
Section: Morphology Of Lms and Molecular Packingmentioning
confidence: 99%
“…The AFM height images show that the surface root-mean-square (RMS) roughness for PTZ-CN, PTZO-CN and PTZDO-CN is 0.579 nm, 1.975 nm and 4.82 nm, respectively, which become increasingly rougher as the sulphur oxidation state increases. 16 Therefore, the ON/OFF current ratio of the device based on PTZO-CN is high, and the device is in its low-conductivity state ("0" state) at low voltage (Fig. Moreover, a smoother morphology may also prevent the aluminum (Al) from penetrating into the organic lm during the vacuum deposition of the aluminum electrode.…”
Section: Morphology Of Lms and Molecular Packingmentioning
confidence: 99%
“…1−3 Ambi-OFETs can be fabricated using one ambipolar material 4,5 or by combining two unipolar materials (p-and n-type). 6,7 The fabrication of highly efficient ambipolar devices using one ambipolar organic material is still being researched, because achieving balanced p-and n-type charge transport in ambient conditions is very difficult with one organic material.…”
Section: ■ Introductionmentioning
confidence: 99%
“…Previous research for balancing electron and hole current has focused on designing new materials 4043 or devising a new approach to blend 44, 45 or stack 46, 47 two materials. While such approaches are very promising, the balance between hole and electron currents may vary depending on the device structure 40, 43 or manufacturing process 42 . Therefore, there is a great need to more clearly understand and control the p-type and n-type charge transport properties through a comprehensive physical analysis.…”
Section: Introductionmentioning
confidence: 99%