EMC of Analog Integrated Circuits

Redout, Jean-Michel; Steyaert, Michiel

doi:10.1007/978-90-481-3230-0

Cited by 95 publications

(57 citation statements)

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“…The nonlinear distortion is caused by the single sinusoidal signal, and the nonlinear distortion is harmonic distortion which is particularly harmful because DC shift appears, the first part of (2) can prove it. The DC shift depends on the even-order nonlinear behaviour and DC shift is a DC effect which is very difficult to remove or filter [4]. As shown in Fig.…”

mentioning

confidence: 98%

Effects of conducted electromagnetic interference on analogue-to-digital converter

Wan¹,

Duval²,

Savatier³

et al. 2011

Electron. Lett.

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The effects of conducted electromagnetic interference on an analogueto-digital converter (ADC) are presented by the measurement. The measurement results reveal that the DC shift behaviour of the output conversion is caused by the continuous-wave interference. The DC shift behaviour produces a novel failure criterion for the immunity measurement of the ADC.Introduction: Analogue-to-digital converters (ADCs) are used widely in closed loop control systems. The ADC affects the stability and control performance of the system directly. In the automotive field, the complex electromagnetic environment (EME) causes electromagnetic compatibility (EMC) problems of the ADC. The effects of the ADC in the presence of electromagnetic interference (EMI) need to be researched. Several works refer to immunity measurement and the immunity model of the ADC, which are introduced in [1, 2], but the models are only compared with the measurement immunity result and the output signal nonlinear distortion of the ADC is not easy to be modelled correctly. If the immunity measurement failure criterion is not well designed, the measurement result cannot reflect the actual behaviour of the ADC, and as a result the measurement result based models cannot work very well. Very little research relates to the analysis of the effects of electromagnetic interference on the ADC. This Letter focuses on the nonlinear distortion of the output signal of the ADC caused by an out-of-band interference. The DC shift phenomenon is detected, analysed and used to perform a novel failure criterion for the immunity measurement. The novel failure criterion based immunity measurement result reflects the accurate behaviour of the ADC in large bandwidth.

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mentioning

confidence: 98%

Effects of conducted electromagnetic interference on analogue-to-digital converter

Wan¹,

Duval²,

Savatier³

et al. 2011

Electron. Lett.

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“…The EMIRR, according to (2), can be used to predict also the voltage offset at higher power injection (corresponding to higher V p ). The following figures (from Fig.4 to Fig.7) show the plots of the voltage offset calculated with the EMIRR and the absolute value of the actual measured one for all the OpAmps under test.…”

Section: Comparison Between the Offset Calculated With The Emirr Pmentioning

confidence: 99%

“…Interference can cause failures or malfunctioning, thus the International Electrotechnical Commission published standards [1] that can be used to qualify ICs in terms of both EMI emission and susceptibility. Analog circuits, and in particular the Operational Amplifiers (OpAmps) are proved to be very susceptible to interference [2]. Radio-Frequency Interference (RFI) induced upset is studied in [3]- [8] and also some solutions for more robust OpAmps have been presented in [9]- [11].…”

Section: Introductionmentioning

confidence: 99%

On the effectiveness of EMIRR to qualify OpAmps

Aimonetto

Fiori

2015

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)

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This paper discusses the pros and cons of the EMIRR, a parameter used to indicate the susceptibility of Operational Amplifiers to ElectroMagnetic Interference. Such a parameter is defined assuming a quadratic relationship between the interference amplitude and the EMI-induced offset. This work shows through analyses and experimental tests that such an assumption is valid only in particular cases, meaning that the application of the EMIRR is limited.

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“…These effects have been extensively studied for MOSFET and bipolar transistors and operational amplifiers [1][2][3][4][5]. However, only very little has been written about these effects in diode-connected MOSFETs assuming that the amplitude of the EMI signal is relatively small [6]. This assumption paves the way for using a Taylor series expansion for approximating the nonlinearity of the diodeconnected NMOSFET, thus, restricting the validity of the results to relatively small EMI signals only.…”

Section: Introductionmentioning

confidence: 98%

Effect of Electromagnetic Interference (EMI) on the DC Shift, Harmonic and Intermodulation Performance of Diode-Connected NMOSFET

Abuelma’atti

Abuelmaatti²

2011

Analog Integr Circ Sig Process

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In this paper a new approximation is presented for the nonlinear relationship between the gate-to-source voltage and the current of a diode-connected NMOSFET. Using this expression closed-form expressions are obtained for the DC and the amplitudes of the fundamental, secondand third-harmonic and intermodulation components of the gate-to-source voltage resulting from exciting the diodeconnected NMOSFET by a DC biasing current plus a superimposed multisinusoidal EMI. Comparison between calculated and simulated results is included.

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EMC of Analog Integrated Circuits

Cited by 95 publications

References 0 publications

Effects of conducted electromagnetic interference on analogue-to-digital converter

Effects of conducted electromagnetic interference on analogue-to-digital converter

On the effectiveness of EMIRR to qualify OpAmps

Effect of Electromagnetic Interference (EMI) on the DC Shift, Harmonic and Intermodulation Performance of Diode-Connected NMOSFET

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