2017 Ieee Autotestcon 2017
DOI: 10.1109/autest.2017.8080516
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Embedded instrumentation toolbox for screening marginal defects and outliers for production

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“…An eye diagram is a method of expressing timing jitter and noise amplitude [25]. In the eye diagram, many data levels and edge transitions are superimposed in two-unit intervals (UI).…”
Section: Ddr3 Memory Test Comparison and Analysismentioning
confidence: 99%
“…An eye diagram is a method of expressing timing jitter and noise amplitude [25]. In the eye diagram, many data levels and edge transitions are superimposed in two-unit intervals (UI).…”
Section: Ddr3 Memory Test Comparison and Analysismentioning
confidence: 99%