Elliptical multilayer Bragg-Fresnel lenses with submicron spatial resolution for X-rays

Erko, A.; Agafonov, Yu. A.; Panchenko, L. A.; Yakshin, Andrey; Chevallier, Pierre; Dhez, P.; Legrand, F.

doi:10.1016/0030-4018(94)90311-5

Cited by 37 publications

(13 citation statements)

References 5 publications

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“…This shows that the zero order appears at the specular direction of the incident beam, while the first grating orders are spatially superimposed for the transmission and on-axis BFL but separated for the off-axis elliptical BFL. 122 These lenses have been used as microprobes 123,124 and for plasma imaging, and, while they did not improve the spatial resolution, they did increase the contrast in a firstorder image. Specially developed software is now able to simulate the focusing and imaging properties of different BFLs 125 to optimize the design of lens characteristics according to the considered application and to evaluate the performance before fabrication.…”

Section: F Bragg-fresnel Opticsmentioning

confidence: 98%

Instrumental aspects of x-ray microbeams in the range above 1 keV

Dhez

Chevallier

Lucatorto

et al. 1999

Review of Scientific Instruments

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X-ray microscopy has the capability of looking into normally opaque samples with high resolution. X rays are sensitive to elemental, structural, and chemical content and thus can provide microscopic maps of the composition and structure of a sample. X-ray microscopy has seen great growth in the last two decades in the number and types of operating instruments as well as their capabilities. This growth is due to two developments. The first is the development of high-brightness second- and third-generation synchrotron light sources that can be used with small-aperture optics. The second is a revolution in x-ray optics. In addition to the extension of commonly used visible optics, such as Fresnel zone plates and multilayer mirrors, into the x-ray regime, there has also been a dramatic improvement in grazing-incidence optics fabrication. In the range up to a few keV, Fresnel zone plates offer the highest resolution, which is below 100 nm in several instruments. Recent developments in fabrication may lead to their application at higher energies; for now, however, sub-μm diffractive microfocusing at higher energies is usually achieved by Bragg–Fresnel optics, Fresnel optics operated in reflection using either crystal planes or multilayer coatings. Although these offer very high resolution, they have small collection apertures and limited wavelength range of operation. The Kirkpatrick–Baez mirror combination remains the most popular and versatile microprobe in the x-ray regime. These systems can operate over a very broad energy range and several facilities are now operating with micron-scale resolution. We will discuss these and some newer types of x-ray focusing schemes.

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Section: F Bragg-fresnel Opticsmentioning

confidence: 98%

Instrumental aspects of x-ray microbeams in the range above 1 keV

Dhez

Chevallier

Lucatorto

et al. 1999

Review of Scientific Instruments

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“…Elliptical lenses can be readily manufactured (Erko et al, 1994). They are also more suitable for the photon energies encountered on the BESSY II storage ring than crystal optics.…”

Section: Figurementioning

confidence: 99%

Diagnostic front end for BESSY II

Peatman

Holldack

1998

J Synchrotron Radiat

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For BESSY II, synchrotron radiation beam diagnostics will be incorporated in both the insertion-device front ends and the dipole-beamline front ends. In order to gain a complete picture of the source characteristics, a diagnostic front end has been designed and tested for dipole radiation. This consists of (i) a pinhole array imaging system, (ii) a double-blade system for the determination of the vertical center of gravity of the synchrotron radiation fan, and (iii) a Bragg±Fresnel multilayer system for the most precise image information about the source size and shape.

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“…The advent of powerful synchrotron sources emitting light over a wide spectral range promoted alternative solutions: addition of grazing incidence mirrors to minimize unwanted high-energies and heat-load, 2 use of periodic multilayers 3 and of focusing elements based on either Fresnel, 4 Bragg-Fresnel, 5 and compound refractive lenses, 6 mirror or multilayers. 7,8,9,10 When flux rather than resolution is desired perfect crystals can be advantageously replaced by periodic multilayers.…”

Section: Introductionmentioning

confidence: 99%

Wideband multilayer mirrors for medium to hard x-ray applications.

et al. 2002

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Recent progress in the design and the manufacturing of wide bandpass x-ray multilayers has opened up new possibilities in hard x-ray optics, particularly in astrophysics and synchrotron x-ray applications.In contrast to previous design based on semi-empirical laws or extensive computer calculation, the recent development of an analytical expression has greatly improved the design of aperiodic multilayer mirrors, allowing to generate any given spectral dependence of the reflectivity. In practice, an approximate differential equation is used to derive an indepth multilayer composition profile whose reflectivity response approaches the desired one. Based on this asymptotic solution, usually sufficiently close to the final solution, the optimum multilayer composition profile is calculated numerically using a classical downhill algorithm.We have studied the intrinsic characteristics of depth-graded multilayers using the procedure described above, with an emphasis put on the important case of a flat reflectivity response over a large but limited spectral range. The performance of depth-graded multilayer mirrors manufactured at ESRF and characterized at the BM5 beamline are presented. The necessity to account at the design level for deposition process parameters, such as chemical composition and thickness errors, and for the effective optical constants is highlighted.

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Elliptical multilayer Bragg-Fresnel lenses with submicron spatial resolution for X-rays

Cited by 37 publications

References 5 publications

Instrumental aspects of x-ray microbeams in the range above 1 keV

Instrumental aspects of x-ray microbeams in the range above 1 keV

Diagnostic front end for BESSY II

Wideband multilayer mirrors for medium to hard x-ray applications.

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