Ellipsometry in Electrochemistry

Paik, Woon‐kie

doi:10.1007/978-1-4615-2876-0_4

Cited by 5 publications

(2 citation statements)

References 89 publications

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“…At high-energy surface electrodes, such as noble metals, the electrodeposition of metals starts by an atomic layer deposition, followed by three-dimensional growth. In situ reflectivity or ellipsometry provides a real time estimate of the film thickness [231], based on the formalism recalled earlier. At low energy surface electrodes, such as carbon or ITO, the electrodeposition of metal is initiated by the stochastic appearance of nuclei which results in particles of broad size distribution.…”

Section: [54] Imaging the Electrodeposition Of Conductive Materialsmentioning

confidence: 99%

“…The contribution of the electrochemical double layer, EDL, can also be probed by optical microscopies. The change of double layer structure with a metal electrode potential induces a change in its macroscale optical reflectivity (electroreflectance) [231,262,263]. The imaging of the influence of ion adsorption or ion cloud distribution in EDL charging is a challenging question as it involves small variation in surface charge and thus requires sensitive detection modes.…”

Section: [56] Probing Non Faradaic Processesmentioning

confidence: 99%

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Electrochemistry and Optical Microscopy

Kanoufi

2021

Encyclopedia of Electrochemistry

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Electrochemistry exploits local current heterogeneities at various scales ranging from the micrometer to the nanometer. The last decade has witnessed unprecedented progress in the development of a wide range of electroanalytical techniques allowing to reveal and quantify such heterogeneity through multiscale and multifonctionnal operando probing of electrochemical processes. However most of these advanced electrochemical imaging techniques, employing scanning probes, suffer from either low imaging throughput or limited imaging size. In parallel, optical microscopies, which can image a wide field of view in a single snapshot, have made considerable progress in terms of sensitivity, resolution and implementation of detection modes. Optical microscopies are then mature enough to propose, with basic bench equipment, to probe in a non destructive way a wide range of optical (and therefore structural) properties of a material in situ, in real time: under operating conditions. They offer promising alternative strategies for quantitative high-resolution imaging of electrochemistry. The first sections recall the optical properties of materials and how they can be probed optically. They discuss fluorescence, Raman, surface plasmon resonance, scattering or refractive index. Then the different optical microscopes used to image electrochemical processes are examined along with some strategies to extract quantitative electrochemical information from optical images. Finally the last section reviews some examples of in situ imaging, at micro-to nanometer resolution, and quantification of electrochemical processes ranging from solution diffusion to the conversion of molecular interfaces or solids.]

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Section: [54] Imaging the Electrodeposition Of Conductive Materialsmentioning

confidence: 99%

Section: [56] Probing Non Faradaic Processesmentioning

confidence: 99%

Electrochemistry and Optical Microscopy

Kanoufi

2021

Encyclopedia of Electrochemistry

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Surface Plasmon Resonance Coupled with Potential‐step Chronoamperometry: Theory and Applications for Quantitative Measurements of Electrodeposited Thin Films

et al. 2019

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Cyclic voltammetry (CV) has been combined with surface plasmon resonance (SPR) for probing electrochemical deposition and redox‐initiated film reorganization and conformational changes. However, the varying potential during CV scans leads to unwanted SPR background changes and complicates interpretation of SPR signals. In this work, we show that, when SPR is coupled with CV, the background correction for underpotential deposition of copper and electropolymerization of aniline is either inaccurate or difficult to perform. For accurate thickness measurements of electrodeposited films, potential‐step (PS) chronoamperometry is a method of choice to combine with SPR. The theory that interprets double‐layer charging is used to explain the advantage of PS chronoamperometry over CV in quantifying the thickness of electrodeposited thin films. The influence of the double‐layer charging on the potential‐induced SPR signal change was analyzed, and the results were used to optimize experimental parameters for PS‐SPR. Overall, PS‐SPR is easier to operate, simpler in data interpretation, and more accurate for the film thickness measurement.

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Electrodics

Modern Electrochemistry 2A

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Ellipsometry in Electrochemistry

Cited by 5 publications

References 89 publications

Electrochemistry and Optical Microscopy

Electrochemistry and Optical Microscopy

Surface Plasmon Resonance Coupled with Potential‐step Chronoamperometry: Theory and Applications for Quantitative Measurements of Electrodeposited Thin Films

Electrodics

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