1987
DOI: 10.1016/s0003-2670(00)82849-4
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Ellipsometry and polarized light

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Cited by 1,526 publications
(1,793 citation statements)
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“…Reflection ellipsometry of the chitosan films was performed using a custom-built self-nulling, single wavelength (λ ) 632.8 nm) ellipsometer 13 and a commercial Multiskop instrument from Optrel GbR. In the ellipsometry experiments, the ellipsometric angles P and A corresponding to a null in the intensity at the detector were measured at fixed values of the angle of incidence θi ranging from 30 o to 60 o .…”
Section: Experimental Methodsmentioning
confidence: 99%
“…Reflection ellipsometry of the chitosan films was performed using a custom-built self-nulling, single wavelength (λ ) 632.8 nm) ellipsometer 13 and a commercial Multiskop instrument from Optrel GbR. In the ellipsometry experiments, the ellipsometric angles P and A corresponding to a null in the intensity at the detector were measured at fixed values of the angle of incidence θi ranging from 30 o to 60 o .…”
Section: Experimental Methodsmentioning
confidence: 99%
“…The change of elliptical polarization upon reflexion is related to the thickness and refractive index of the adlayer (Azzam & Bashara, 1977). Let the state of polarization of a beam be characterized by s/, the ratio of the amplitudes of the p and s polarizations:…”
Section: Ellipsometrymentioning
confidence: 99%
“…The polarization-dependent tensor describing SHG has up to 18 unique tensor elements defining its orientation and polarization-dependent response, compared with just three for linear optics (i.e. the three principal refractive indices; Hubbard, 1995;Azzam & Bashara, 1988). Consequently, a significantly greater amount of information is available from detailed nonlinear optical polarization measurements and analysis relative to analogous linear effects such as birefringence.…”
Section: Introductionmentioning
confidence: 99%