2012 25th International Conference on VLSI Design 2012
DOI: 10.1109/vlsid.2012.95
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Eliminating Performance Penalty of Scan

Abstract: Stringent performance requirements magnify the performance degradation impact of Design-for-Testability (DfT) techniques. As more aggressive performance optimizations are being employed, resulting in high-performance designs with reduced logic depth, the impact of scan multiplexers is becoming even more magnified. In this work, we propose a scan cell transformation technique that transfers the scan multiplexer delay from the input of the flip-flop to its output, enabling the removal of the scan multiplexer del… Show more

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Cited by 4 publications
(10 citation statements)
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References 30 publications
(26 reference statements)
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“…The retimed scan, therefore, can test DC as well as delay faults. Benchmark results show further timing improvement and reduced hardware overhead compared to previously reported results [10]. …”
mentioning
confidence: 50%
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“…The retimed scan, therefore, can test DC as well as delay faults. Benchmark results show further timing improvement and reduced hardware overhead compared to previously reported results [10]. …”
mentioning
confidence: 50%
“…A recently proposed method [10] to reduce the performance penalty of scan modifies the critical path of Figure 1 (b) as shown in Figure 2. The multiplexer is moved forward to the output of the destination flip-flop (original FF) and is replaced by a fanout that feeds into an added flip-flop (shadow FF) through an additional multiplexer.…”
Section: Previous Workmentioning
confidence: 99%
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