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Savchenko, E. V.; Grigorashchenko, O. N.; Ogurtsov, A. N.; Rudenkov, V. V.; Gumenchuk, G. B.; Lorenz, Martin; Lammers, Andreas; Bondybey, V. E.

doi:10.1023/a:1004861103722

Cited by 28 publications

(39 citation statements)

References 11 publications

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“…The clearly seen structure of the curves reasonably agrees with the previously measured yield of TSL detected in the M-band [6,7] and the yield of TSEE [5] with the only difference that the curves in Fig. 1 show more distinct features.…”

Section: Methodssupporting

confidence: 89%

“…The low-temperature peak at 11.5 K is related to the electron traps in a subsurface layer or at inner interfaces of the sample. The peak at about 15 K exhibiting the pronounce dose dependence was assigned to radiation-induced defects [5,6,8,9]. A rather strong TSEE maximum observed between 37 and 41 K is presumably due to electrons trapped too deep in the sample to be promoted to the conduction band, which are however released on the sample evaporation.…”

Section: Methodsmentioning

confidence: 98%

“…This peak was detected in the total yield of TSL [5,8] and in intrinsic recombination emissionspectrally resolved TSL in the M-band [6] taken from Ar pre-irradiated by a 1 keV electron beam as well as from Ar pre-irradiated by x-rays [7]. Note, that the peak at 23 K was also registered in the thermally stimulated conductivity [9] and in thermally stimulated exoelectron emission [5].…”

Section: Methodsmentioning

confidence: 99%

“…Moreover, the first successful experiments on thermally stimulated exoelectron emission (TSEE) [5] offered the prospect for developing of low-temperature comprehensive activation spectroscopy technique as applied to cryocrystals.…”

Section: Introductionmentioning

confidence: 99%

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Oxygen-driven relaxation processes in pre-irradiated Ar cryocrystals

Savchenko

Белов

Gumenchuk

et al. 2006

Low Temperature Physics

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Relaxation processes in oxygen-containing Ar cryocrystals pre-irradiated by low-energy electrons are studied with the focus on the role of diffusion controlled atom-atom recombination reaction of oxygen in the relaxation cascades. The results of correlated in real time measurements of thermally stimulated phenomena are presented. The experiments have been performed using activation spectroscopy methods -thermally stimulated exoelectron emission and spectrally resolved thermally stimulated luminescence. Solid evidence of the radiative mechanism of electron detrapping triggering the relaxation cascades is obtained.

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Section: Methodssupporting

confidence: 89%

Section: Methodsmentioning

confidence: 98%

Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Oxygen-driven relaxation processes in pre-irradiated Ar cryocrystals

Savchenko

Белов

Gumenchuk

et al. 2006

Low Temperature Physics

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“…For this purpose we developed a low temperature modification of correlation spectroscopy, i.e., simultaneous measurements of TSL, TSEE and desorption of neutral atoms [8] from pre-irradiated RGS. In our previous experiments, TSEE was detected from solid Ar [9] and Ne [10,11]. In this article we present our results of an activation spectroscopy study in solid Xe pre-irradiated with an electron beam.…”

Section: Introductionmentioning

confidence: 81%

Thermally stimulated exoelectron emission from solid Xe

Khyzhniy

Grigorashchenko

Savchenko

et al. 2007

Low Temperature Physics

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Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that electron traps in unannealed samples are characterized by a much broader distribution of trap levels in comparison with annealed samples and their concentration exceeds in number that in annealed samples. Both phenomena, TSL and TSEE, were found to be triggered by release of electrons from the same kind of traps. The data obtained suggest a competition between two relaxation channels: charge recombination and electron transport terminated by TSL and TSEE. It was found that TSEE predominates at low temperatures while at higher temperatures TSL prevails. An additional relaxation channel, a photon-stimulated exoelectron emission from pre-irradiated solid Xe, was revealed. PACS: 78.60.Kn Thermoluminescence; 79.75.+g Exoelectron emission.

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Photon‐stimulated charge recombination and exoelectron emission from pre‐irradiated solid Ar

Gumenchuk¹,

Bludov²,

Белов³

et al. 2007

Phys. Status Solidi (c)

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Spatially separated stable charge centers -self-trapped holes, trapped electrons, dopant ionic centers and radicals were generated in an Ar matrix doped with Xe and N 2 by a low energy electron beam. A combination of the cathodoluminescence (CL) with the photon-stimulated luminescence (PSL) and photonstimulated exoelectron emission (PSEE) methods was used to monitor center formation and selected relaxation channels -charge recombination reactions and exoelectron emission. PSEE from pre-irradiated Ar samples was registered simultaneously with N line emission. Vacuum ultraviolet (VUV) intrinsic and extrinsic recombination luminescence from pre-irradiated samples has been detected to confirm the suggested relaxation path of the stored energy. An afterglow of the N line can be considered as an internal source of photons which releases electrons from the traps and being a triggering mechanism of relaxation processes: (i) -exoelectron emission, (ii) -radiative recombination of charge species. 1 Introduction An exposure of solid insulators to ionizing radiation results in generation of metastable centers such as self-trapped/trapped charge carriers and structural defects. Spatially separated charge carriers remain stable at low temperatures after completing irradiation. Relaxation processes can be stimulated by heating or by photon flux. In our study we focused on the photon-stimulated relaxation.Methods of activation spectroscopy are especially powerful tools for the investigation of a relaxation in solids and the method of thermally stimulated luminescence (TSL) is the most common in use [1][2][3][4][5][6][7]. Recent experiments revealed thermally stimulated exoelectron emission (TSEE) from solid Ne [8] and Ar [9,10]. The latter studies showed a correlation in the yields of exoelectrons and VUV photons of the intrinsic recombination emission from pre-irradiated solid Ar. It was suggested [11] and then demonstrated [5,6,10] that thermally stimulated recombination of neutral guest O atoms in Ar matrix followed by O 2 * formation at 23 K and radiative decay of O 2 results in the emission of exoelectrons from solid Ar. It posed the question on the influence of visible light on the relaxation path in rare-gas solids (RGS).Relaxation processes in RGS are still not clearly understood. There are only a few publications dedicated to PSEE [5,10,12] and to the intrinsic VUV recombination luminescence caused by an external photon source [13].We present new results -relaxation channels involving photon-stimulated radiative recombination (intrinsic and extrinsic) of charge centers with electrons in VUV range and corresponding PSEE.

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Cited by 28 publications

References 11 publications

Oxygen-driven relaxation processes in pre-irradiated Ar cryocrystals

Oxygen-driven relaxation processes in pre-irradiated Ar cryocrystals

Thermally stimulated exoelectron emission from solid Xe

Photon‐stimulated charge recombination and exoelectron emission from pre‐irradiated solid Ar

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