2003
DOI: 10.1063/1.1542889
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Elemental surface analysis at ambient pressure by electron-induced x-ray fluorescence

Abstract: The development of a portable surface elemental analysis tool, based on the excitation of characteristic x rays from samples at ambient pressure with a focused electron beam is described. This instrument relies on the use of a thin electron transmissive membrane to isolate the vacuum of the electron source from the ambient atmosphere. The major attributes of this instrument include rapid ͑several minutes͒ spectrum acquisition, nondestructive evaluation of elemental composition, no sample preparation, and high-… Show more

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Cited by 12 publications
(4 citation statements)
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References 6 publications
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“…Although X-ray excitation using radioactive sources or X-ray tubes is almost universally used in portable XRF instrumentation, an interesting 'proof-of-concept' instrument using focused electron excitation was described by Feldman et al 106 This instrument incorporated a thin electron transmissive membrane to isolate the vacuum of the electron source from the ambient atmosphere and was evaluated in the nondestructive analysis of metal and mineral samples to a spatial resolution of better than several hundreds of micrometres.…”
Section: Portable and Mobile Xrfmentioning
confidence: 99%
“…Although X-ray excitation using radioactive sources or X-ray tubes is almost universally used in portable XRF instrumentation, an interesting 'proof-of-concept' instrument using focused electron excitation was described by Feldman et al 106 This instrument incorporated a thin electron transmissive membrane to isolate the vacuum of the electron source from the ambient atmosphere and was evaluated in the nondestructive analysis of metal and mineral samples to a spatial resolution of better than several hundreds of micrometres.…”
Section: Portable and Mobile Xrfmentioning
confidence: 99%
“…Free electron sources are needed in many applications like e-beam based material analysis [1], ebeam lithography [2], displays, but also sensing devices like vacuum gauges [3] and flow sensors [4], etc. However, for handling stable electron emissions, high vacuum conditions are needed, which require complex (and thus expensive) systems.…”
Section: Introductionmentioning
confidence: 99%
“…A schematic configuration of such a micromachined electron source is showed in Figure 1. In [1] a device without reaction chamber has been presented. The cavity was fabricated by wafer bonding.…”
Section: Introductionmentioning
confidence: 99%
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