1994
DOI: 10.1016/0584-8547(94)80079-0
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Elemental mass spectrometry using a nitrogen microwave-induced plasma as an ion source

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Cited by 56 publications
(39 citation statements)
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“…The wide use of this excitation source can be expected, so a detailed study of the matrix effect will be reported. By the way, quite a few applications of the high power N 2 -MIP as an excitation source for atomic emission spectrometry (AES) were performed for the determination of trace elements in a variety of real samples [12,13,14,15,16,17,18,19,20,21,22,23,24,25]. Trace concentrations of bismuth and tellurium can affect the physical and mechanical properties of metals and metal alloys.…”
Section: Introductionmentioning
confidence: 99%
“…The wide use of this excitation source can be expected, so a detailed study of the matrix effect will be reported. By the way, quite a few applications of the high power N 2 -MIP as an excitation source for atomic emission spectrometry (AES) were performed for the determination of trace elements in a variety of real samples [12,13,14,15,16,17,18,19,20,21,22,23,24,25]. Trace concentrations of bismuth and tellurium can affect the physical and mechanical properties of metals and metal alloys.…”
Section: Introductionmentioning
confidence: 99%
“…about 20-30-fold lower than in the Ar-ICP. These calculated degrees of ionization are in good agreement with those obtained experimentally by using N 2 -MIP-MS. 37 The differCalculation of Electron Number Density ence in the degree of ionization between the N 2 -MIP and Usually, the electron number density can be obtained by Ar-ICP is attributed to the ionization temperatures of both measuring the Stark broadening of the hydrogen line ( H b : plasmas. When analyte elements are introduced into a plasma 486.13 nm) without any assumption of LTE.2-4,39, 41 An attempt that has a higher temperature, the ionization equilibrium is was made to use the hydrogen line profile to measure the shifted in favour of ions, i.e., ionization of elements prevails in electron number density; however, as shown in Fig.…”
Section: Comparison Of Degree Of Ionization Between N 2 -Mip and Ar-icpmentioning
confidence: 99%
“…The details of this cavity are described in ref. 37 The emission profiles for both Ca I and Ca II are shown in Photonics, Hamamatsu, Japan). 2 mm above the choke and at the centre of the plasma.…”
mentioning
confidence: 99%
“…Surface analysis methods, for example X-ray photoelectron spectroscopy (XPS), scanning electron microscope (SEM) and electron probe micro analyzer (EPMA), [3][4][5][6] were known to be effective tools for analyzing F; however, specific chemical information concerning slag could not be obtained. Solid-state nuclear magnetic resonance (NMR) with a 19 F and 31 P cross polarization/magic angle spinning ( 19 F{ 31 P}CP/MAS) method 7 can also be applied to analyze the chemical state of F;…”
Section: Introductionmentioning
confidence: 99%
“…The Okamoto-cavity produces an annular flame-like plasma in which the electric field of the microwaves is concentrated at the surrounding portion of the plasma, resulting in a doughnut-like structure; therefore, a sample mist or gas can be easily introduced into a central channel of the plasma, as similar to ICP. The Okamoto cavity can provide various quite stable plasmas, such as N2, O2, Air, Ar and He plasma, 14,17 and has been variously used as a new plasma source for spectrometry, [18][19][20][21][22][23][24][25][26] including F analysis. [13][14][15] In this study we examined the hydrolytic decomposition of F compounds up to 1000 C by analyzing F continuously using He-MIP-OES.…”
Section: Introductionmentioning
confidence: 99%