2010
DOI: 10.1007/s10947-010-0210-0
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Elemental composition analysis of silicon carbonitride thin films by energy dispersive spectroscopy

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Cited by 8 publications
(3 citation statements)
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“…It is known that EDS is a semi‐quantitative and not much precise method to determine the element concentrations at thin films. There are additional difficulties in EDS analysis of N‐DLC films: carbon and nitrogen elements are light and have close atomic numbers . Despite these limitations, our results demonstrated (Table ) that EDS analysis is a good method to assess qualitatively the chemical composition of the films.…”
Section: Resultsmentioning
confidence: 99%
“…It is known that EDS is a semi‐quantitative and not much precise method to determine the element concentrations at thin films. There are additional difficulties in EDS analysis of N‐DLC films: carbon and nitrogen elements are light and have close atomic numbers . Despite these limitations, our results demonstrated (Table ) that EDS analysis is a good method to assess qualitatively the chemical composition of the films.…”
Section: Resultsmentioning
confidence: 99%
“…The obtained results prove the conclusions The elemental composition of the films was determined by the method of energy dispersive spectroscopy. For more validity of the results of elemental analysis only those values of the electron beam energy (~5-7 keV) and thickness of the film (500-600 nm) were used, which we found to be optimal in the course of the performed investigation [64]. The data obtained are given below.…”
Section: Determination Of Chemical Phase Compositions and Types Of mentioning
confidence: 99%
“…In EDS, it is important to have a standard sample for calibration with chemical composition, crystalline structure, smooth surface and phase that is close to the sample that is going to be assessed (Rumyantsev et al 2010). In this experiment, hematite (Fe2O3) was used as a calibration for the BFS.…”
Section: Energy Dispersive Spectroscopy (Eds)mentioning
confidence: 99%