1949
DOI: 10.1007/bf00589232
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Elektronenmikroskopische Abbildung von Membranfilteroberfl�chen

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Cited by 11 publications
(1 citation statement)
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“…An assisting in situ microscope could significantly improve probing efficiency. Similar inconvenience also exists in other types of electronic microscopes, including the scanning electron microscope (SEM) [8] , the transmission electron microscope (TEM) [9][10][11] , the scanning tunneling microscope (STM) [12] , tip-enhanced Raman spectroscopy (TERS) [13] , and photoemission electronic microscopy (PEEM) [14] . Several methods have been tried to solve this problem.…”
Section: Introductionmentioning
confidence: 91%
“…An assisting in situ microscope could significantly improve probing efficiency. Similar inconvenience also exists in other types of electronic microscopes, including the scanning electron microscope (SEM) [8] , the transmission electron microscope (TEM) [9][10][11] , the scanning tunneling microscope (STM) [12] , tip-enhanced Raman spectroscopy (TERS) [13] , and photoemission electronic microscopy (PEEM) [14] . Several methods have been tried to solve this problem.…”
Section: Introductionmentioning
confidence: 91%