1999
DOI: 10.1016/s0955-2219(98)00418-x
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Electrostriction measurements on low permittivity dielectric materials

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Cited by 20 publications
(14 citation statements)
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“…Besides, several research groups have experimentally observed that the intrinsic electrostrictive coefficient Q defined in Eq. (1) is inversely proportional to the product of the Young modulus and dielectric permittivity [12][13][14]…”
Section: S Q Pmentioning
confidence: 99%
“…Besides, several research groups have experimentally observed that the intrinsic electrostrictive coefficient Q defined in Eq. (1) is inversely proportional to the product of the Young modulus and dielectric permittivity [12][13][14]…”
Section: S Q Pmentioning
confidence: 99%
“…Such behaviour had previously been observed by Scott (1999) in ferroelectric thin films such as SrTiO 3 . In RTA, the actual bending of the planes was produced by an electrostrictive strain, ij , defined by a fourth rank tensor, ijkl , and the quadratic coupling of the strain to the electric field, E k E l (Yimnirun et al, 1999):…”
Section: Introductionmentioning
confidence: 99%
“…The electrostriction strain coefficient, measured in both thin films and ceramics at room temperature, is at least 2 orders of magnitude higher 9 , 15 , 18 27 than expected from the empirical scaling law proposed by Newnham and co-workers. 28 , 29 …”
Section: Introductionmentioning
confidence: 99%