Electrostatic and Kelvin Probe Force Microscopy for Domain Imaging of Ferroic Systems

Rodriguez, Brian J.

doi:10.1002/9781118935743.ch14

Nanoscale Ferroelectrics and Multiferroics 2016

DOI: 10.1002/9781118935743.ch14

|View full text |Cite

Electrostatic and Kelvin Probe Force Microscopy for Domain Imaging of Ferroic Systems

Brian J. Rodriguez¹

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2017

Publication Types

Select...

Article1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

(1 citation statement)

References 200 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The development of noncontact techniques capable of simultaneously probing surface topography and material functionalities such as magnetic dipoles, − surface charge, , electrochemical potentials, , and dielectric properties, − have made it possible to noninvasively characterize key material functionalities on submicron and even atomic length scales. In particular, techniques such as electrostatic force microscopy (EFM) ,, and Kelvin probe force microscopy (KPFM) , have been crucial to the joint investigations of structural, electronic, and electrochemical functionality on a range of materials including ferroelectrics, , semiconductors, , biosystems, − photovoltaics, , as well as battery and fuel cell devices. − …”

mentioning

confidence: 99%

Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform

Collins¹,

Ahmadi

et al. 2017

ACS Nano

View full text Add to dashboard Cite

Atomic force microscopy (AFM) offers unparalleled insight into structure and material functionality across nanometer length scales. However, the spatial resolution afforded by the AFM tip is counterpoised by slow detection speeds compared to other common microscopy techniques (e.g., optical, scanning electron microscopy, etc.). In this work, we develop an ultrafast AFM imaging approach allowing direct reconstruction of the tip-sample forces with ∼3 order of magnitude higher time resolution than is achievable using standard AFM detection methods. Fast free force recovery (FR) overcomes the widely viewed temporal bottleneck in AFM, that is, the mechanical bandwidth of the cantilever, enabling time-resolved imaging at sub-bandwidth speeds. We demonstrate quantitative recovery of electrostatic forces with ∼10 μs temporal resolution, free from influences of the cantilever ring-down. We further apply the FR method to Kelvin probe force microscopy (KPFM) measurements. FR-KPFM is an open loop imaging approach (i.e., no bias feedback), allowing ultrafast surface potential measurements (e.g., <20 μs) to be performed at regular KPFM scan speeds. FR-KPFM is demonstrated for exploration of ion migration in organometallic halide perovskite materials and shown to allow spatiotemporal imaging of positively charged ion migration under applied electric field, as well as subsequent formation of accumulated charges at the perovskite/electrode interface. In this work, we demonstrate quantitative FR-KPFM measurements-however, we fully expect the FR approach to be valid for all modes of noncontact AFM operation, including noninvasive probing of ultrafast electrical and magnetic dynamics.

show abstract

mentioning

confidence: 99%

Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform

Collins¹,

Ahmadi

et al. 2017

ACS Nano

View full text Add to dashboard Cite

show abstract

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

hi@scite.ai

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Electrostatic and Kelvin Probe Force Microscopy for Domain Imaging of Ferroic Systems

Cited by 1 publication

References 200 publications

Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform

Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform

Contact Info

Product

Resources

About