Electrophoretic deposition and properties of strontium-doped sodium potassium niobate thick films

Mercier, Hugo; Malič, Barbara; Hreščak, Jitka; Levassort, Franck; Kuščer, Danjela

doi:10.1016/j.jeurceramsoc.2017.06.030

Cited by 8 publications

(9 citation statements)

References 44 publications

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“…Similar polishing and fine-polishing procedures can also be applied to polycrystalline thick films prior to scanning [60,61]. However, the polishing time for thick films is much shorter in Dust and an interfacial layer between the tip and the sample can affect the PFM signal ( figure 8).…”

Section: Polishing and Cleaning Prior To A Pfm Analysismentioning

confidence: 99%

“…Similar polishing and fine-polishing procedures can also be applied to polycrystalline thick films prior to scanning [60,61]. However, the polishing time for thick films is much shorter in comparison to the bulk samples, because thick films are only a few tens of micrometres thick.…”

Section: Polishing and Cleaning Prior To A Pfm Analysismentioning

confidence: 99%

“…The term 'thick films' denotes films thicker than 1 µm and prepared by powderbased routes. Most publications discuss the PFM analysis of piezo/ferroelectric properties in thick films prepared by low-density deposition methods, such as screen-printing [60,[108][109][110][111][112], electrophoretic deposition [61], tape-casting [113] or inkjet printing [114]. Only a few papers report the PFM analysis of thick films prepared by high-density deposition methods [115,116].…”

Section: Pfm Studies Of the Domain Structure In Polycrystalline Thick Filmsmentioning

confidence: 99%

“…Some examples of the domain structure in thick films are given below. The PFM scanning can be performed on virgin [108][109][110][111][112]114,115] or polished [60,61] thick-film surfaces. The surface of the virgin thick films is usually very rough (in the micrometre range); therefore, the scanning of large areas (tens of micrometres) is difficult for non-polished samples, but more feasible for polished ones.…”

Section: Pfm Studies Of the Domain Structure In Polycrystalline Thick Filmsmentioning

confidence: 99%

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Investigations of ferroelectric polycrystalline bulks and thick films using piezoresponse force microscopy

Uršič,

Prah

2019

Proc. R. Soc. A.

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In recent years, ferroelectric/piezoelectric polycrystalline bulks and thick films have been extensively studied for different applications, such as sensors, actuators, transducers and caloric devices. In the majority of these applications, the electric field is applied to the working element in order to induce an electromechanical response, which is a complex phenomenon with several origins. Among them is the field-induced movement of domain walls, which is nowadays extensively studied using piezoresponse force microscopy (PFM), a technique derived from atomic force microscopy. PFM is based on the detection of the local converse piezoelectric effect in the sample; it is one of the most frequently applied methods for the characterization of the ferroelectric domain structure due to the simplicity of the sample preparation, its non-destructive nature and its relatively high imaging resolution. In this review, we focus on the PFM analysis of ferroelectric bulk ceramics and thick films. The core of the paper is divided into four sections: (i) introduction; (ii) the preparation of the samples prior to the PFM investigation; (iii) this is followed by reviews of the domain structures in polycrystalline bulks; and (iv) thick films.

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Section: Polishing and Cleaning Prior To A Pfm Analysismentioning

confidence: 99%

“…Similar polishing and fine-polishing procedures can also be applied to polycrystalline thick films prior to scanning [60,61]. However, the polishing time for thick films is much shorter in comparison to the bulk samples, because thick films are only a few tens of micrometres thick.…”

Section: Polishing and Cleaning Prior To A Pfm Analysismentioning

confidence: 99%

Section: Pfm Studies Of the Domain Structure In Polycrystalline Thick Filmsmentioning

confidence: 99%

Section: Pfm Studies Of the Domain Structure In Polycrystalline Thick Filmsmentioning

confidence: 99%

See 2 more Smart Citations

Investigations of ferroelectric polycrystalline bulks and thick films using piezoresponse force microscopy

Uršič,

Prah

2019

Proc. R. Soc. A.

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“…In our previous work, we processed strontium‐modified sodium potassium niobate thick films with the nominal composition ((K 0.5 Na 0.5 ) 0.99 Sr 0.005 NbO 3 , KNNSr) by EPD from an ethanol‐based suspension and did preliminary sintering in air and oxygen 22,23 . We observed that during the deposition and/or sintering, the KNNSr tended to crack or even delaminated from the substrate when the thickness of the as‐deposited layers was more than ~50 μm.…”

Section: Introductionmentioning

confidence: 99%

Microstructure evolution and electromechanical properties of (K,Na) NbO₃‐based thick films

2020

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This study investigated an unconventional method of electrophoretic deposition (EPD) for the processing of environmentally benign (K 0.5 Na 0.5) 0.99 Sr 0.005 NbO 3 (KNNSr) thick films on Pt/alumina substrate. EPD allows rapid, economical, and low-waste processing of thick films and thus offers an integration advantage for electronics manufacturing. To understand the functional response of the KNNSr thick films, the effect of the sintering temperature and atmosphere on their structure, microstructure, and electromechanical properties was investigated. KNNSr thick films densify in constrained conditions in a very narrow temperature range only a few 10°C below the melting temperature of 1140°C. Up to 1100°C the relative density increases to 80%, upon further heating to 1110°C we observed only the grain growth and pore coalescence. The densification is not affected significantly by the atmosphere. The local domain structure of 25-33 μm thick KNNSr films was similar, while the dielectric and electromechanical properties increased with the increasing sintering temperature. KNNSr thick film sintered at 1100°C has a thickness-coupling factor k t of 0.4, comparable to that of bulk. The results reveal that the EPD enables the economic processing of high-performance thick films on complex-shape substrates that are difficult to fabricate using conventional thick-film methods.

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Processing issues with inorganic electrocaloric materials and structures

Malič

Fulanović

Kabakov

et al. 2023

The Electrocaloric Effect

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Electrophoretic deposition and properties of strontium-doped sodium potassium niobate thick films

Cited by 8 publications

References 44 publications

Investigations of ferroelectric polycrystalline bulks and thick films using piezoresponse force microscopy

Investigations of ferroelectric polycrystalline bulks and thick films using piezoresponse force microscopy

Microstructure evolution and electromechanical properties of (K,Na) NbO₃‐based thick films

Processing issues with inorganic electrocaloric materials and structures

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Electrophoretic deposition and properties of strontium-doped sodium potassium niobate thick films

Cited by 8 publications

References 44 publications

Investigations of ferroelectric polycrystalline bulks and thick films using piezoresponse force microscopy

Investigations of ferroelectric polycrystalline bulks and thick films using piezoresponse force microscopy

Microstructure evolution and electromechanical properties of (K,Na) NbO3‐based thick films

Processing issues with inorganic electrocaloric materials and structures

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Product

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Microstructure evolution and electromechanical properties of (K,Na) NbO₃‐based thick films