Electrooptical modulation of broadband light with Gaussian amplitude distribution over the spectrum

Lopatina, P. S.; Криштоп, В. В.; Stroganov, V. I.; Syuĭ, A. V.; Maksimenko, V. A.; Tolstov, E. V.; Litvinova, M. N.

doi:10.1134/s0030400x12080097

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Cited by 3 publications

(2 citation statements)

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“…One of the widely used physical properties in practice is the electro-optical properties of a material, which, in turn, are determined by electro-optical coefficients [5][6][7]. From general physical considerations, the values of electro-optical coefficients should depend on the type of crystal, composition, and method of its growth.…”

Section: Introductionmentioning

confidence: 99%

Determination of Electro-Optical Coefficients of Lithium Niobate Crystals

Syuy

Prokopiv

Сидоров

et al. 2019

KEM

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Section: Introductionmentioning

confidence: 99%

Determination of Electro-Optical Coefficients of Lithium Niobate Crystals

Syuy

Prokopiv

Сидоров

et al. 2019

KEM

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“…When carrying out measurements using certain types of optical instruments, polarized light is used. The results of using such optical instruments depend on the type and degree of light polarization [1]. To control the degree of polarization, /4( /2) phase plates are generally used.…”

Section: Introductionmentioning

confidence: 99%

Conformity Check of Thickness to the Crystal Plateλ/4(λ/2)

Syuy¹,

Shtarev²,

Криштоп³

et al. 2013

Journal of Spectroscopy

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This work demonstrates that if crystal plates are identical in thickness in the direction of radiation, the intensity at the output of the polarizer-crystal-crystal-analyzer system equals zero. This means that it is possible to control the difference in thickness between the reference crystal plate (e.g., plates ofλ/4orλ/2) and the examined plate by the intensity of the transmitted radiation. Further, it shows that if nonmonochromatic radiation is used, then the spectrum of radiation at the output is determined by the relative orientation of the optical elements and their sizes. The paper gives the theoretical model for calculations of profile of spectra for the number of important cases of orientation of elements.

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