“…Existing reports focus on ionization potential and work function measurements, which can only provide insight into one aspect of the electronic properties of the interface and provide indirect evidence of the electronic structure at the interface, including speculation on the formation of a dipole at the MoO 3 /organic interface,[4c,7] with the strength of the dipole at the interface given by the difference in WF of the two materials forming the interface. [7a,b] Such a dipole could generate intermediate energy states and strongly impact on the charge transfer over the interface,[3a,7d] however, observations that the WF and ionization energy of MoO 3 change with the thickness of the deposited MoO 3 layer[5b,7d,8] and the gradual change in the WF of indium tin oxide (ITO)/[6,6]‐phenyl C 71 butyric acid methyl ester (PC 71 BM) reported by Chunhui, which was assigned to a new specimen charge flow complex and interaction of the materials are inconsistent with this model.…”