2013
DOI: 10.1016/j.carbon.2013.07.091
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Electronic structure of MoO3−x/graphene interface

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Cited by 46 publications
(52 citation statements)
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“…Based on the distinctive electronic properties of graphene, the BE shift of C 1s core level can be explained by the shift of graphene E F from its E D because of the p‐type doping of graphene upon oxygen species adsorption . Similar phenomenon has been reported in our previous work concerning the deposition of MoO 3 − x and hexadecafluorophthalocyanine (F 16 CuPc) molecules on graphene surface . In addition, no obvious oxidized C peaks appear at the higher BE after graphene has been stored for 12 months, which suggests that the graphene itself is not easy to be oxidized at room temperature …”
Section: Resultssupporting
confidence: 74%
See 1 more Smart Citation
“…Based on the distinctive electronic properties of graphene, the BE shift of C 1s core level can be explained by the shift of graphene E F from its E D because of the p‐type doping of graphene upon oxygen species adsorption . Similar phenomenon has been reported in our previous work concerning the deposition of MoO 3 − x and hexadecafluorophthalocyanine (F 16 CuPc) molecules on graphene surface . In addition, no obvious oxidized C peaks appear at the higher BE after graphene has been stored for 12 months, which suggests that the graphene itself is not easy to be oxidized at room temperature …”
Section: Resultssupporting
confidence: 74%
“…Among these, CVD growth has been emphasized because of the high performance/price ratio. Copper (Cu) is one of the most common metallic substrates used in the previous studies because of the fact that it is much easier or simpler to grow single layer graphene (SLG) on the Cu foil compared with other metallic substrates . Recently, Ruoff's group studied the impact of the Cu surface oxygen on the growth of graphene and pointed out that oxygen on the Cu surface greatly inhibited the graphene nucleation density by passivating the Cu surface active sites.…”
Section: Introductionmentioning
confidence: 99%
“…Existing reports focus on ionization potential and work function measurements, which can only provide insight into one aspect of the electronic properties of the interface and provide indirect evidence of the electronic structure at the interface, including speculation on the formation of a dipole at the MoO 3 /organic interface,[4c,7] with the strength of the dipole at the interface given by the difference in WF of the two materials forming the interface. [7a,b] Such a dipole could generate intermediate energy states and strongly impact on the charge transfer over the interface,[3a,7d] however, observations that the WF and ionization energy of MoO 3 change with the thickness of the deposited MoO 3 layer[5b,7d,8] and the gradual change in the WF of indium tin oxide (ITO)/[6,6]‐phenyl C 71 butyric acid methyl ester (PC 71 BM) reported by Chunhui, which was assigned to a new specimen charge flow complex and interaction of the materials are inconsistent with this model.…”
Section: Introductionmentioning
confidence: 99%
“…[23][24][25][26] Further, lithography typically involves the use of solvents and chemicals that might affect or degrade the properties of doped graphene. [8][9][10][11]21,[27][28][29][30][31] Here, we show that all of these challenges for efficient graphene-based TCEs can be effectively addressed at once via a thin (>10 nm) metal oxide (MoO 3 or WO 3 ) coating of the graphene. The metal oxide can be deposited by various means, 9,18,19 but we focus here on thermal evaporation.…”
mentioning
confidence: 99%