2012
DOI: 10.1007/s00339-012-6856-z
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Electronic structure and transport measurements of amorphous transition-metal oxides: observation of Fermi glass behavior

Abstract: We characterized the conduction mechanisms in thin sputtered films of three representative binary Me-O (Me = Ta, W, and Nb) systems as a function of oxygen content, by combining in situ chemical state and electronic band structure studies from X-ray photoemission with temperature-dependent transport measurements. Despite certain differences, these amorphous films all displayed Fermi glass behavior following an oxidation-induced transition from metallic to hopping conduction, down to a sub-percolation threshold… Show more

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Cited by 60 publications
(43 citation statements)
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“…In figure 4 (b) and figure 4 (c), ln (R) versus T −1/4 are plotted, where both experimental curves are well-fitted with equation (1). Therefore, N(E F ) could be extracted based on T 0 (from the fitting slopes) and α (0.2 nm −1 which is estimated from literatures24252627). Consequently, the hopping distance l 0 and activation energy W could be obtained from: …”
Section: Results and Disscussionmentioning
confidence: 99%
“…In figure 4 (b) and figure 4 (c), ln (R) versus T −1/4 are plotted, where both experimental curves are well-fitted with equation (1). Therefore, N(E F ) could be extracted based on T 0 (from the fitting slopes) and α (0.2 nm −1 which is estimated from literatures24252627). Consequently, the hopping distance l 0 and activation energy W could be obtained from: …”
Section: Results and Disscussionmentioning
confidence: 99%
“…This process is termed the SET process. [17,28,29] The localized high V O concentration regions in turn create V O concentration gradients that can lead to spontaneous V O diffusion and results in the retention failure at LRS. The small shift of the minimum current location to V= −0.03 V during RESET may be attributed to the nanobattery effect caused by the inhomogeneous distribution of charged defects.…”
Section: Perovskite Filmsmentioning
confidence: 99%
“…In active metallic filament devices, the ion migration, involving redox reactions and ion motility, leads to different filament growth modes . The stoichiometric change of the material in the redox process could introduce unwanted impurity‐driven doping, which affects the electronic structure of the material . In nonfilamentary synaptic devices working by other mechanisms such as charge trapping or detrapping, higher switching uniformity could be obtained.…”
Section: Introductionmentioning
confidence: 99%