Electronic Speckle Pattern Interferometry

Løkberg, Ole J.

doi:10.1007/978-94-009-3609-6_36

Cited by 24 publications

(18 citation statements)

References 39 publications

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“…This type of filter was originally proposed for time-average vibration ESPI fringes instead of speckle pattern subtraction. 9 This crude filtering works extremely well and in real-time. It has proved possible to calculate phase directly from addition fringes filtered in this way, without image processing to further enhance fringe visibility.…”

Section: ͑5͒mentioning

confidence: 98%

Low‐frequency harmonic vibration analysis with double‐pulsed addition electronic speckle pattern interferometry

Moore¹,

Pérez-López

1996

Opt. Eng

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We describe the control of a pulsed laser for measuring harmonic vibrations with double-pulsed addition electronic speckle pattern interferometry (ESPI). The basic requirement is to synchronize the laser pulses both to a known position of the object vibration cycle (to obtain a stationary fringe pattern) and to a charge coupled device (CCD) camera (to obtain one double pulse per field.) It is shown theoretically and experimentally that at low object-vibration frequencies (typically Ͻ500 Hz) these synchronization requirements can cause instabilities in the laser output. A synchronization scheme to overcome these problems is described and experimental results presented at several low objectvibration frequencies. Addition fringe visibility is improved in real-time with an electronic filter. © 1996 Society of Photo-Optical Instrumentation Engineers.Subject terms: double-pulsed electronic speckle pattern interferometry; addition electronic speckle pattern interferometry; vibration measurement.Paper 03105

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Section: ͑5͒mentioning

confidence: 98%

Low‐frequency harmonic vibration analysis with double‐pulsed addition electronic speckle pattern interferometry

Moore¹,

Pérez-López

1996

Opt. Eng

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“…In ESPI the most important optimisation parameter is the contrast of the secondary interference fringes [4,9]. LCSI is applied using phase-shifting and subtraction of the resulting phase maps.…”

Section: Signal-to-noise Ratiomentioning

confidence: 99%

“…Electronic Speckle Pattern Interferometry (ESPI) [3,4] is used for optical non-destructive testing based on interferometrical deformation measurement.…”

Section: Introductionmentioning

confidence: 99%

Optimisation of Low-Coherence Speckle Interferometry (LCSI) for characterisation of multi-layered materials

Gastinger

Winther

2005

Nano- And Micro-Metrology

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In this paper the optical parameters of Low Coherence Speckle Interferometry (LCSI) are analysed in order to optimise the technique and increase the probing depth. The contrast of the interference signal depends on the configuration of the optical setup and the optical properties of the material. Theoretical investigations and measurements for optimising the beam ratio, the coherence function and imaging parameters are presented. By optimising the interference signal the probing depth of the technique can be extended. This is demonstrated for a semi-transparent polymer material. Finally, measurements of the deformation of interfaces in a multi-layered material are presented.

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“…In speckle interferometry, interferograms are recorded [7] as they are applied to obtain two-and three-dimensional deformation fields [8] of a deforming object. As the electronic cameras have been developed and reached the consumer market, this field has been dominated by the electronic speckle pattern interferometry (ESPI) [9,10]. The dynamics of the speckle patterns obtained within all these applications are typically processed by speckle correlation [11] or spatial filtering velocimetry [12].…”

Section: Introductionmentioning

confidence: 99%

Distance measurements by speckle correlation of objective speckle patterns, structured by the illumination

Jakobsen

Hanson

2012

Appl. Opt.

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Objective speckles produced by two beams overlapping and interfering on a rough object surface contain information about the angle of incidence of the two beams, and how well they overlap. We obtain the autocovariance function for such a speckle pattern, and demonstrate how the information carried by the objective speckles can be used to probe the distance between the object and the observation plane. From a distance of 75 mm to a distance of 150 mm, and using an angle of 0.3 deg between the two incident beams, we can measure the actual distance with an uncertainty of better than 0.1% of the full range. As long as the beams overlap at the object surface, the proposed method can measure distance with an uncertainty inversely proportional to the spot size at the object.

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Electronic Speckle Pattern Interferometry

Cited by 24 publications

References 39 publications

Low‐frequency harmonic vibration analysis with double‐pulsed addition electronic speckle pattern interferometry

Low‐frequency harmonic vibration analysis with double‐pulsed addition electronic speckle pattern interferometry

Optimisation of Low-Coherence Speckle Interferometry (LCSI) for characterisation of multi-layered materials

Distance measurements by speckle correlation of objective speckle patterns, structured by the illumination

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