2007 IEEE Aerospace Conference 2007
DOI: 10.1109/aero.2007.353007
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Electronic Speckle Pattern Interferom-etry for JWVST

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(1 citation statement)
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“…Commonly used methods for introducing deformations, such as precision motorized steppers or piezo-electric manipulators do not currently provide the accuracy, precision and resolution required to calibrate SPS-DSPI. Instead, a novel method of introducing a well-known deformation was introduced 11,12 ; a single crystal silicon monolith Calibration Reference Article (CRA) was developed, designed to provide a predictable and uniform Coefficient of Thermal Expansion (CTE) and therefore a known change in height between reference surfaces when exposed to a temperature change. This allowed characterization of the relative accuracy of the interferometer in the nm regime.…”
Section: Calibration Reference Articlementioning
confidence: 99%
“…Commonly used methods for introducing deformations, such as precision motorized steppers or piezo-electric manipulators do not currently provide the accuracy, precision and resolution required to calibrate SPS-DSPI. Instead, a novel method of introducing a well-known deformation was introduced 11,12 ; a single crystal silicon monolith Calibration Reference Article (CRA) was developed, designed to provide a predictable and uniform Coefficient of Thermal Expansion (CTE) and therefore a known change in height between reference surfaces when exposed to a temperature change. This allowed characterization of the relative accuracy of the interferometer in the nm regime.…”
Section: Calibration Reference Articlementioning
confidence: 99%