Electronic reliability engineering in the 21st century

Pecht, Michael

doi:10.1109/emap.2001.983947

Cited by 7 publications

(10 citation statements)

References 54 publications

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“…The second class includes physical deterioration (i.e., wearout [63]) and external interference through physical phenomena (e.g., lightning stroke). Early and premature wearout failures are caused by the displacement of the mean and variability due to manufacturing, assembly, handling, and misapplication [64].…”

Section: Hardware Fault Modelmentioning

confidence: 99%

The Fault Assumptions in Distributed Integrated Architectures

Obermaisser¹,

Peti²

2007

SAE Technical Paper Series

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Distributed integrated architectures in the automotive and avionic domain result in hardware cost reduction, dependability improvements, and improved coordination between application subsystems compared to federated systems. In order to support safety-critical application subsystems, a distributed integrated architecture needs to support fault-tolerance strategies that enable the continued operation of the system in the presence of failures. The basis for the implementation and validation of faulttolerance strategies are realistic fault assumptions, which are captured in a fault hypothesis. This paper describes a fault hypothesis for distributed integrated architectures, which takes into account the sharing of the communication and computational resources of a single distributed computer system among multiple application subsystems. Each node computer serves for the execution of multiple jobs. In analogy, the communication network interconnecting the node computers has to support message exchanges of more than one application subsystem. Using a generic system model of a distributed integrated architecture, we argue in favor of a differentiation of fault containment regions for hardware and software faults. Based on these fault containment regions, we discuss the failure modes, the failure rates, the maximum number of failures, and the recovery intervals. In particular, the fault hypothesis describes the assumptions concerning the respective frequencies of transient and permanent failures in consideration of recent semiconductor trends.

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Section: Hardware Fault Modelmentioning

confidence: 99%

The Fault Assumptions in Distributed Integrated Architectures

Obermaisser¹,

Peti²

2007

SAE Technical Paper Series

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“…In contrast to wearout failures that affect the entire population, infant mortality failures tend to affect only a subpopulation of the shipped product [21]. The reliability curve visualizes that the average failure rate of an ECU in the useful life period is very high.…”

Section: Assumptions Behind the Fault Modelmentioning

confidence: 99%

“…The bathtub curve is divided into three distinct phases, the infant mortality, the useful life, and the wearout phase. According to [21] infant mortality failures are typically due to mistakes made during the manufacturing process. Thus, improved manufacturing can significantly reduce the incidence of such failures (i.e.…”

Section: Assumptions Behind the Fault Modelmentioning

confidence: 99%

A Maintenance-Oriented Fault Model for the DECOS Integrated Diagnostic Architecture

Peti

Obermaisser

Ademaj

et al.

19th IEEE International Parallel and Distributed Processing Symposium

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The increasing use of electronics in the automotive and avionic domain has lead to dramatic improvements with respect to functionality, safety, and cost. However, with this growth of electronics the likelihood of failures due to faults originating from electronic equipment also increases. In order to tackle prevalent diagnostic problems such as the reduction of the fault-not-found ratio, a maintenance-oriented fault model is needed that serves as the basis for the classification of experienced failures.In this paper we introduce such a maintenance-oriented fault model that establishes the conceptual foundation of the diagnostic services of the DECOS integrated architecture. The fault model takes the component-based nature of today's distributed embedded systems into account. According to this model each experienced failure is classified according to the field replaceable units of the system.

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“…researchers that any reliability model should reflect device fabrication technology, geometries, and materials. Notice changed was observed where editions C, D, E and F of this handbook were published in 1979,1982,1986 and 1995 respectively [10].…”

Section: Literature Reviewmentioning

confidence: 99%

“…Pecht [10] suggested abandoning the usage of the MIL-HDBK-217 after reviewing the development history of the reliability quantification methods, the advances in technology, and the drawbacks of these methods. His conclusion may be overstated, but he point out some problems embedded in these methods.…”

Section: Literature Reviewmentioning

confidence: 99%

A virtual predictive environment for monitoring reliability, life time, and maintainability of printed circuit boards

Dababneh

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Electronic reliability engineering in the 21st century

Cited by 7 publications

References 54 publications

The Fault Assumptions in Distributed Integrated Architectures

The Fault Assumptions in Distributed Integrated Architectures

A Maintenance-Oriented Fault Model for the DECOS Integrated Diagnostic Architecture

A virtual predictive environment for monitoring reliability, life time, and maintainability of printed circuit boards

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