1983
DOI: 10.1051/jphys:01983004406071300
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Electronic properties of hydrogenated amorphous silicon-germanium alloys

Abstract: 2014 On décrit les propriétés électroniques de quelques alliages amorphes de silicium et de germanium hydrogénés a-SixGe1-x: H riches en silicium (x > 0,6). Tout d'abord nous montrons que ces alliages subissent des effets photo-induits du type de ceux décrits par Staebler et Wronski pour a-Si:H. Les propriétés électroniques sont alors étudiées en fonction de la concentration en germanium et de l'histoire photothermique des films. Les changements observés de la conductivité entre l'état recuit et l'état ir… Show more

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Cited by 29 publications
(5 citation statements)
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“…Among several limitations, poor electronic quality of amorphous silicon germanium (a-SiGe:H) layers in multijunction cells limits the performance of solar cells [1,2]. However, main advantages of this material are that (i) its optical gas can be easily tuned to match the wide range (1.7-1.2 eV) of the solar radiation spectrum [3] and (ii) light-induced degradation of such materials is less than that of normal bandgap a-Si:H materials [4]. Before 1986, several endeavours [3,[5][6][7][8] failed to develop device grade a-SiGe:H alloy films by discharging silane (SiH 4 ) and germane (GeH 4 ) gas mixtures in diode/triode glow discharge systems.…”
Section: Introductionmentioning
confidence: 99%
“…Among several limitations, poor electronic quality of amorphous silicon germanium (a-SiGe:H) layers in multijunction cells limits the performance of solar cells [1,2]. However, main advantages of this material are that (i) its optical gas can be easily tuned to match the wide range (1.7-1.2 eV) of the solar radiation spectrum [3] and (ii) light-induced degradation of such materials is less than that of normal bandgap a-Si:H materials [4]. Before 1986, several endeavours [3,[5][6][7][8] failed to develop device grade a-SiGe:H alloy films by discharging silane (SiH 4 ) and germane (GeH 4 ) gas mixtures in diode/triode glow discharge systems.…”
Section: Introductionmentioning
confidence: 99%
“…Thus potential fluctuation due to inhomogeneity within helium-diluted a-SiGe:H films will be substantially less than that in hydrogen-diluted films. According to the model of Branz and Silver [1] helium-diluted alloys are more stable than hydrogen-diluted films under similar light-soaking conditions.…”
Section: Discussionmentioning
confidence: 99%
“…Moreover, it has been observed experimentally that the nature of metastable changes under prolonged illumination of amorphous silicon alloy materials, such as amorphous silicon germanium (a-SiGe:H), is rather complicated. Light-induced degradation of a-SiGe:H is significantly lower than that of a-Si:H [1,2], but the initial electronic properties of a-SiGe:H in the range of optical gap 1.7 to 1.5 eV are more of less the same as those of a-Si:H. There is endeavour to explain these experimental findings by thermodynamic arguments. From defect pool calculations which are primarily based on thermodynamic relations for equilibrium and non-equilibrium states, defect generation kinetics and saturated carrier density depend on the equilibrium charge carrier density which is a function of the optical gap of the materials [3,4].…”
Section: Introductionmentioning
confidence: 99%
“…Contrarily, the density of deep defects in the bandgap increases with increased Ge alloying which finally degrades the lifetime of photogenerated carriers [3][4][5]. Even though earlier studies reported negligible Staebler-Wronski effect (SWE) in a-SiGe:H mainly due to poor material quality available at those times [6,7], high quality alloy films prepared after improved deposition systems exhibited a substantial SWE under light soaking similar to that intrinsic to pure a-Si:H [8][9][10][11][12][13][14][15][16]. For this reason, investigations of the light induced defect creation as well as native defects in the alloy as a function of Ge content has become an important issue to be understood and resolved both scientifically and technologically.…”
Section: Introductionmentioning
confidence: 95%