Electronic Ordering States in Strongly Correlated Electron System Studied by Resonant X-ray Scattering

Abstract

Resonant X-ray scattering (RXS) is a powerful tool for observing orderings of electronic degrees of freedom, i.e. charge, orbital, spin, and multiples. In this paper, we review recent developments of RXS technique in the soft X-ray region, and the RXS experiments in strongly correlated electron system.