Electronic excitations on clean and adsorbate covered Pd(111) by angle resolved electron energy loss spectroscopy

Netzer, H.; Gomati, M. M. El

doi:10.1016/0039-6028(83)90333-3

Cited by 61 publications

(12 citation statements)

References 12 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The data can be directly compared to the experimental electron energy loss spectrum, where a feature in the experimental spectrum at 14 eV has been assigned to the 1 ͑5s͞1p ! 2p ‫ء‬ ͒ transition [20]. Although this value is close to the calculated 1 ͑5s͞1p !…”

supporting

confidence: 62%

See 1 more Smart Citation

Prediction of Electronic Excited States of Adsorbates on Metal Surfaces from First Principles

et al. 2001

View full text Add to dashboard Cite

We present the first ab initio prediction of localized electronic excited states in a periodically infinite condensed phase, a heretofore intractable goal. In particular, we examined local excitations within a CO molecule adsorbed on Pd(111). The calculation allows a configuration interaction treatment of a local region, while its interaction with the extended condensed phase is described via an embedding potential obtained from periodic density functional theory. Our work lays the foundation of a microscopic understanding of photochemistry and spectroscopy on metal surfaces.

show abstract

supporting

confidence: 62%

“…Although this value is close to the calculated 1 ͑5s͞1p ! 2p ‫ء‬ ͒ excitation energy of CO bound to Pt 2 (11.3-12.7 eV) [21], our results clearly suggest the assignment of Netzer et al [20] to be incorrect. Indeed, it has been pointed out in Ref.…”

mentioning

confidence: 51%

Prediction of Electronic Excited States of Adsorbates on Metal Surfaces from First Principles

et al. 2001

View full text Add to dashboard Cite

show abstract

“…3c, and exhibits a maximum intensity at approximately 346.4 eV (Pd 3d 3/2 peak at 340.13 eV). Plasmon shifts of 6 to 7 eV were reported by Rocca et al [37,38] and Netzer et al [39] using angle resolved EELS. At low temperatures (444 K in Fig.…”

Section: Heating Cyclementioning

confidence: 72%

Carbon incorporation during ethene oxidation on Pd(111) studied by in situ X-ray photoelectron spectroscopy at 2×10−3 mbar2×10−3 mbar

Gabasch

Kleimenov

Teschner

et al. 2006

Journal of Catalysis

View full text Add to dashboard Cite

The oxidation of ethene on the Pd(111) surface was studied in the temperature range 330 K to 923 K by in-situ XPS and mass spectrometry both during heating and cooling in a reaction mixture of 5x10 -4 mbar C 2 H 4 and 1.5x10 -3 mbar O 2 . Carbon-containing surface species were found to be strongly predominant over oxygen species within the whole temperature range, despite the excess of oxygen in the gas phase. Diffusion of carbon into the palladium bulk started at 480 K, leading at ~500 K to the appearance of an electronically altered, dissolved carbon phase with a C1s binding energy of 284.45eV, which extended over several layers in the near-surface region and was stable up to ~650 K. This spectroscopic trend was clearly related to a pronounced shift of catalytic selectivity toward CO. Above 660K the dissolved carbon species decomposed and the reaction took place on an adsorbate-depleted Pd metal surface, with CO as the main product. During the cooling ramp the same surface-near carbon modification formed at a 70 degree lower threshold temperature, inducing a pronounced hysteresis of the catalytic selectivity.

show abstract

“…3(a) shows a Pd 3d XPS spectrum collected from a sample prepared by dosing bilayer SiO 2 /Ru(0001) with ∼9 × 10 13 Pd/cm 2 at 150 K. Relative to the curved background, which is present prior to Pd adsorption, we note three distinct doublet features after fitting the spectrum (we will refer to the 3d 5/2 components when discussing peak positions). The lower BE components at ß334.7 and ß337.1 eV are thought to relate to photoemission from different Pd species on the surface of the sample, whereas the higher BE feature at ß341 eV, which is necessary to properly fit the small peak at ß346 eV, is attributed to electrons leaving the sample after contributing energy to Pd plasmon excitations [37]. Returning to the two primary features, we note that one is shifted below, and the other above, the BE obtained from a Pd(111) reference sample (335.05 eV)-see analogous plot in Fig.…”

Section: Resultsmentioning

confidence: 99%

Understanding surface core-level shifts using the Auger parameter: A study of Pd atoms adsorbed on ultrathin SiO2films

et al. 2014

View full text Add to dashboard Cite

Auger parameter ( α) measurements have been employed to determine the extent to which initial-and final-state effects govern surface core-level shifts in x-ray photoelectron spectroscopy (XPS) measurements of Pd atoms confined between a bilayer SiO 2 film and its Ru(0001) support. For atoms bound in this manner, we note negative binding energy shifts ( BEs) of ß0.3 eV, relative to the Pd 3d peak position in the bulk, and attribute these shifts to large variations in the initial-state orbital energies of the supported atoms (ß1.1 eV towards E F ), coupled with decreased final-state relaxation contributions (ß0.8 eV). Theoretical calculations reveal that, despite small partial positive charges and decreased final-state screening, the decreased 4d-5sp hybridization of the undercoordinated Pd atoms results in large enough upward 3d orbital-energy shifts to yield the net-negative BE noted by XPS.

show abstract

Electronic excitations on clean and adsorbate covered Pd(111) by angle resolved electron energy loss spectroscopy

Cited by 61 publications

References 12 publications

Prediction of Electronic Excited States of Adsorbates on Metal Surfaces from First Principles

Prediction of Electronic Excited States of Adsorbates on Metal Surfaces from First Principles

Carbon incorporation during ethene oxidation on Pd(111) studied by in situ X-ray photoelectron spectroscopy at 2×10−3 mbar2×10−3 mbar

Understanding surface core-level shifts using the Auger parameter: A study of Pd atoms adsorbed on ultrathin SiO2films

Contact Info

Product

Resources

About