2021
DOI: 10.1016/j.cplett.2021.138507
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Electronic, electrical and dielectric analysis of Cr-doped hydroxyapatite

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Cited by 14 publications
(22 citation statements)
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“…1 at% in Ti-HA, seems to be insufficient to cause any shift in the XRD peaks of HA. 2,36,49,50 The presence of Ti in Ti-HA however was confirmed by the EDX spectra shown in Fig. 3(d).…”
Section: Resultsmentioning
confidence: 79%
“…1 at% in Ti-HA, seems to be insufficient to cause any shift in the XRD peaks of HA. 2,36,49,50 The presence of Ti in Ti-HA however was confirmed by the EDX spectra shown in Fig. 3(d).…”
Section: Resultsmentioning
confidence: 79%
“…Figure 3 shows the XPS results for the CrN-PtIr coating. As shown in Figure 3a, the Cr-N (574.6 eV) and Cr-O (577.4 eV) bound states were further identified in the Cr 2p 1/2 spectrum [23], while the Cr-N (583.9 eV) and Cr-O (587.2 eV) bound states were further verified in the Cr 2p 3/2 spectrum [8,24]. The binding energies at 396.8 eV are attributed to the Cr-N bond (Figure 3b) [25].…”
Section: Resultsmentioning
confidence: 83%
“…This finding corroborates prior research showing that HA has a high dielectric constant at low frequencies, and it also satisfies the criteria for inclusion in the category of materials with a large dielectric constant. 58,59 In addition, the decreases in dielectric constant, surface potential, and agglomeration observed when increasing the HA content above 10% also contributed to the decrease in TENG output performance when adding more HA to the PDMS. Fig.…”
Section: Resultsmentioning
confidence: 99%