Electronic counterfeit detection based on the measurement of electromagnetic fingerprint

Abstract

International audienceCounterfeit integrated circuits become a big challenge for the whole electronic industry. The use of electronic counterfeits can cause reduced performance of circuits, or failure of the whole system. New efficient approaches of counterfeit device detection are always required. Since the electromagnetic emission level of integrated devices depends on various circuit parameters like technology, manufacturing and aging, the electromagnetic emission measurement could be an approach to detect the counterfeit. In this article, the principles of the methodology are explained and two case studies are presented, where three ways of analysis of data are discussed

Uncertainty and Sensitivity of the Feature Selective Validation (FSV) Method

“…Several validation methods have been proposed in various fields of science; for example, those applied to economics, crystallography, and electromagnetics, and they have been reviewed, discussed, and quantitatively assessed and confronted for some test cases [9]. The relatively recent Feature Selective Validation (FSV) method [10] is a complex and complete validation tool with wide applicability to several fields of engineering, with particular emphasis on electronic and electrical engineering: pure EMC applications were presented in 2010 from studying reverberating chambers [11], and near-and far field radiation from heatsinks [12]; a thorough validation of a railway line model against experimental data is discussed in [13], with considerations on the influence of second-order system elements; counterfeiting detection via electromagnetic fingerprint is instead evaluated in [14]; finally, the modeling of a high voltage direct current system is discussed in [15]. Older examples can be found, especially in the field of microelectronics, when models of semiconductor devices began to appear at different levels of complexity [1], and are now widely available resources in many desktop circuit simulators.…”