Electronic component reliability

Jensen, Finn

doi:10.1109/maes.1999.765777

Cited by 34 publications

(17 citation statements)

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“…The failure criteria takes a measure of the PCB response and uses this to produce a failure metric, where the failure metric may be Mean Time To Failure (MTTF), cycles to failure, probability of mission success or any other of a number of failure metrics (see IEEE [26]; Jensen [28]; O'Connor [47] for a discussion of failure metrics). The many different approaches to creating this data can be conveniently split up into Analytical and Empirical categories.…”

Section: Failure Criteriamentioning

confidence: 99%

Reliability Analysis of Electronic Equipment Subjected to Shock and Vibration – A Review

Amy

Aglietti

Richardson

2009

Shock and Vibration

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Abstract. Increasingly modern electronic equipment is expected to provide more functionality whilst still being able to withstand shock and vibration loads. The process of reliability prediction has been hampered by the complicated response and failure characteristics of electronic equipment, with the currently available methods being a compromise between accuracy and cost. A process to quickly and confidently predict the reliability of proposed electronic equipment to dynamic loads would greatly benefit industry. This paper will illustrate the difficulties in predicting electronic equipment reliability, showing why progress has been slow, in addition to the difficulty in making a model that works across a broad range of equipment configurations. The four classes of reliability prediction methods (Handbook, Test data, Field data and Physics of Failure) will be contrasted before addressing the individual methods.It is pertinent to note that although the majority of failures in electronic equipment are due to thermal issues, this review focuses on shock and vibration induced failures.

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Section: Failure Criteriamentioning

confidence: 99%

Reliability Analysis of Electronic Equipment Subjected to Shock and Vibration – A Review

Amy

Aglietti

Richardson

2009

Shock and Vibration

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“…This approach is based on the energy storage concept originally introduced into reliability engineering by Haviland [13,15]. We detail below the basis of this healthy components concept.…”

Section: Approach To Load-strengthmentioning

confidence: 99%

Reliability determination of aluminium electrolytic capacitors by the mean of various methods. Application to the protection system of the LHC

2004

Microelectronics Reliability

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To cite this version:Frédéric Perisse, Pascal Venet, Gérard Rojat. Reliability determination of aluminium electrolytic capacitors by the mean of various methods. Application to the protection system of the LHC. Microelectronics Reliability, Elsevier, 2004, 44 (9-11) AbstractThe lifetime of power electronic components is often calculated from reliability reports, but this method can be discussed. We compare in this article the results of various reliability reports to an accelerated ageing test of component and introduced the load-strength concept. Large aluminium electrolytic capacitors are taken here in example in the context of the protection system of LHC (Large Hadron Collider) in CERN where the level of reliability is essential. We notice important differences of MTBF (Mean Time Between Failure) according to the reliability report used. Accelerating ageing tests carried out prove that a Weibull law is more adapted to determinate failure rates of components. The load-strength concept associated with accelerated ageing tests can be a solution to determine the lifetime of power electronic components.

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“…However significant evidence contradicts this tripartite form of λ(t) which authors usually call bathtub curve. For instance, researchers show the irregular degeneracy of electronic circuits [2]. The hazard rate presents humps so evident that Wong [3] labels this: "roller coaster distribution".…”

Section: Introductionmentioning

confidence: 99%

Reshaping the Science of Reliability with the Entropy Function

Rocchi

Capacci

2015

Entropy

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Abstract:The present paper revolves around two argument points. As first, we have observed a certain parallel between the reliability of systems and the progressive disorder of thermodynamical systems; and we import the notion of reversibility/irreversibility into the reliability domain. As second, we note that the reliability theory is a very active area of research which although has not yet become a mature discipline. This is due to the majority of researchers who adopt the inductive logic instead of the deductive logic typical of mature scientific sectors. The deductive approach was inaugurated by Gnedenko in the reliability domain. We mean to continue Gnedenko's work and we use the Boltzmann-like entropy to pursue this objective. This paper condenses the papers published in the past decade which illustrate the calculus of the Boltzmann-like entropy. It is demonstrated how the every result complies with the deductive logic and are consistent with Gnedenko's achievements.

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Electronic component reliability

Cited by 34 publications

References 0 publications

Reliability Analysis of Electronic Equipment Subjected to Shock and Vibration – A Review

Reliability Analysis of Electronic Equipment Subjected to Shock and Vibration – A Review

Reliability determination of aluminium electrolytic capacitors by the mean of various methods. Application to the protection system of the LHC

Reshaping the Science of Reliability with the Entropy Function

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