1972
DOI: 10.1541/ieejfms1972.92.36
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Electronic Breakdown in Polyethylene Film in Room Temperature Range

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Cited by 13 publications
(6 citation statements)
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“…Figure (B) shows the correlation of DCBD versus spherulite size for both LDPE and LLDPE. These results show a strong correlation between DCBD and spherulite size and that DCBD values decrease significantly as spherulite sizes increase which is consistent with previous studies . Thus, the reduced spherulite sizes had a greater impact on the electrical breakdown strength than the slight reduction in % crystallinity.…”
Section: Resultssupporting
confidence: 92%
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“…Figure (B) shows the correlation of DCBD versus spherulite size for both LDPE and LLDPE. These results show a strong correlation between DCBD and spherulite size and that DCBD values decrease significantly as spherulite sizes increase which is consistent with previous studies . Thus, the reduced spherulite sizes had a greater impact on the electrical breakdown strength than the slight reduction in % crystallinity.…”
Section: Resultssupporting
confidence: 92%
“…The β value correlates to the size distribution of defects or filler particles such that poor dispersion of the silica particles leads to lower β values . Therefore this result indicates that the dispersion of silica in the 1 wt % OTMS sample is improved compared to the 3 wt % sample . The higher breakdown strengths reported here are consistent with improved breakdown strengths documented in previous studies with silica/PE composites…”
Section: Resultssupporting
confidence: 89%
“…It should be noted that the field magnitude due to electron acceleration appears slightly lower, compared to hole transport. The shaded area below the broken line illustrates experimentally observed breakdown properties of polymer insulators [5], which reveals saturation and maximum attainable breakdown fields at approximately 10MV/cm, towards low mobility values < 5 × 10 −3 cm 2 /V/s. From timeof-flight data, also the high field hole drift time τ crit has be estimated (not shown) from Fig.…”
Section: A Impact Ionization and Critical Fieldmentioning
confidence: 94%
“…Furthermore, the above mentioned pre-factor R Ins 0 may additionally vary with time, due to the superimposed dynamics of the impact ionization process, according to (5). Thus, in a generalized case, the insulator resistance would be given by…”
Section: Electro-thermal Instabilitymentioning
confidence: 99%
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