2015
DOI: 10.1063/1.4917236
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Electronic band structure of compressively strained Ge1−xSnx with x < 0.11 studied by contactless electroreflectance

Abstract: Articles you may be interested inContactless electroreflectance and theoretical studies of band gap and spin-orbit splitting in InP1−xBix dilute bismide with x ≤ 0.034 Appl. Phys. Lett. 105, 222104 (2014); 10.1063/1.4903179 Contactless electroreflectance of In As ∕ In 0.53 Ga 0.23 Al 0.24 As quantum dashes grown on InP substrate: Analysis of the wetting layer transition

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Cited by 37 publications
(36 citation statements)
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“…The mobility values of carriers of the “light” holes band should be essentially higher than those of carriers of the “heavy” holes band, and hence, upon this transfer the hole partial contribution to the electrical conduction should be significantly enhanced. In a line with this conjecture, two recent studies on “compressively strained” by Sn-doping germanium81 and strained films of pure germanium82 clearly documented the above proposed splitting of the “heavy” and “light” holes bands.…”
Section: Discussionmentioning
confidence: 62%
“…The mobility values of carriers of the “light” holes band should be essentially higher than those of carriers of the “heavy” holes band, and hence, upon this transfer the hole partial contribution to the electrical conduction should be significantly enhanced. In a line with this conjecture, two recent studies on “compressively strained” by Sn-doping germanium81 and strained films of pure germanium82 clearly documented the above proposed splitting of the “heavy” and “light” holes bands.…”
Section: Discussionmentioning
confidence: 62%
“…Moreover, recent investigations have made possible to achieve strained GeSn with large α-Sn content [35,36]. Figure 4 shows Poisson equation could be done [20] but this is not done in the present work.…”
Section: Absorption Spectrum: Modeling and Resultsmentioning
confidence: 83%
“…In his work Aspnes omits the terms corresponding to 1/E 2 ; however, in the case of large broadening it can play a significant role and hence we included it in the model. A simplified TDLS model is often used [48][49][50], but it is valid only in the case of low and uniform electrical perturbation of the crystal material [51,52]. Low perturbation can be estimated from the experiment as the case of R/R 10 −4 [47].…”
Section: Experimental Methodsmentioning
confidence: 99%