Electron yield X-ray absorption spectroscopy at atmospheric pressure

Tourillon, G.; Dartyge, E.; Fontaine, A.; Lemonnier, M.; Bartol, F.

doi:10.1016/0375-9601(87)90015-6

Cited by 83 publications

(23 citation statements)

References 7 publications

(1 reference statement)

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“…XANES measurements at Sb L 1 edge (4698 eV) were carried out on the E4 station, using as monochromator a Si (1 1 1) double crystal. The XANES data for films were recorded in total electron yield detection mode using the detector developed by Tourillon et al 4 XANES spectra were normalized far from the edge (∼4750 eV) and analyzed in comparison to Sb 2 O 3 and FeSbO 4 references to determine the Sb oxidation in the Sb-doped SnO 2 thin films. EXAFS data were recorded at Sb K edge (30491 eV) and Sn K edge (29200 eV) of ROMO II station at HASYLAB, equipped with a Si (3 1 1) double crystal monochromator which was set to 60% in order to eliminate higher harmonics.…”

Section: Methodsmentioning

confidence: 99%

EXAFS investigation on Sb incorporation effects to electrical transport in SnO2 thin films deposited by sol–gel

Geraldo

Briois

Scalvi

et al. 2007

Journal of the European Ceramic Society

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The effect of Sb doping in SnO 2 thin films prepared by the sol-gel dip-coating (SGDC) process is investigated. Electronic and structural properties are evaluated through synchrotron radiation measurements by EXAFS and XANES. These data indicate that antimony is in the oxidation state Sb 5+ and replaces tin atoms (Sn 4+ ), at a grain surface site. Although the substitution yields net free carrier concentration, the electrical conductivity is increased only slightly, because it is reduced by the high grain boundary scattering. The overall picture leads to a shortening of the grain boundary potential, where oxygen vacancies compensate for oxygen adsorbed species, decreasing the trapped charge at grain boundary.

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Section: Methodsmentioning

confidence: 99%

EXAFS investigation on Sb incorporation effects to electrical transport in SnO2 thin films deposited by sol–gel

Geraldo

Briois

Scalvi

et al. 2007

Journal of the European Ceramic Society

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“…Ion chambers, photodiodes, He-¯ow electron (Tourillon et al, 1987) and¯uorescence (Lytle et al, 1984) detectors have been used in experiments. These detectors and an XY remote-controlled sample holder stand on a 1.60 m-long rail aligned to the beam direction.…”

Section: à4mentioning

confidence: 99%

Commissioning and first results of the LNLS XAFS beamline

Tolentino

Cezar

Cruz

et al. 1998

J Synchrotron Radiat

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An X-ray absorption ®ne-structure spectroscopy beamline has been installed and commissioned at a bending-magnet source at LNLS. Three monochromators are available: a channel-cut, a double-crystal and a four-crystal set-up. They have been operated from 2500 up to 15 000 eV, with a resolving power better than 5500 in the full range. Photon¯ux of the order of 10 8 photons s À1 up to 10 10 photons s À1 has been attained. The experimental station is equipped with a table that can withstand a weight of 300 kg and track the vertical position of the beam with a 2.5 mm accuracy over a 120 mm stroke. The beamline has been fully characterized and the ®rst results are presented.

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“…The polarized X-ray absorption spectra were measured by means of the total electron yield detection apparatus and the method described in [21] on the beamline D2 (EXAFSII) at DCI with a positron beam energy of 1.85GeV and a maximum stored current of 285 mA. Data were collected with a two flat Si 311 single crystal monochromator.…”

Section: X-ray Beam and Recording Apparatus Informationmentioning

confidence: 99%

Comparative Study of the Polarized XANES at the Cu K Edge of Bi₂Sr₂Ca₁Cu₂O₈, Bi₂Sr₂Ca₂Cu₃O₁₀, and Y₁Ba₂Cu₃O₇ Thin Films

Poumellec

Cortès²,

Labdi

et al. 1992

Physica Status Solidi (b)

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The angular dependence of the Cu K edge in films of BiSrCaCuO (2212, 2223) and YBa2Cu3O7 are measured for both orientations (e ⟂ c, e ∥ c). A similar XANES is observed (but magnitudes and energy positions change slightly) although the compounds are quite different except the first shell. Specifically, anisotropy spectra are very close. After connecting the same XANES features to the local arrangement, it is found that the pyramidal site in 2223 is flattened compared to the one in 2212 by only (0.003 ± 0.001) nm. In addition, it is deduced that the electron density in the copper sphere is similar in all compounds whatever the site (CuII). Then, taken into consideration that pyramidal sites in 2212 and in YBaCuO are rather close to each other, an estimate is deduced of the absorption edge arising from the chain site following the two polarization directions. The major resonance on these spectra yields 0.009 nm of distance anisotropy, a result in very good agreement with the XRD data. In the course of the discussion, it is explained why the anisotropy spectrum is smaller in YBaCuO than in 2212. Lastly, the difference spectrum published by Tranquada et al. on oxygen reduction of YBa2Cu3Ox is revisited. It is deduced that the electron density increases in the copper sphere as soon as x = 7 when the copper atoms in the chains change from four to three oxygen coordination. Then, when the local structure evolves from three to two oxygen coordination, the local valence on the copper sphere does not change anymore but on the bridging oxygen.

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Electron yield X-ray absorption spectroscopy at atmospheric pressure

Cited by 83 publications

References 7 publications

EXAFS investigation on Sb incorporation effects to electrical transport in SnO2 thin films deposited by sol–gel

EXAFS investigation on Sb incorporation effects to electrical transport in SnO2 thin films deposited by sol–gel

Commissioning and first results of the LNLS XAFS beamline

Comparative Study of the Polarized XANES at the Cu K Edge of Bi₂Sr₂Ca₁Cu₂O₈, Bi₂Sr₂Ca₂Cu₃O₁₀, and Y₁Ba₂Cu₃O₇ Thin Films

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Electron yield X-ray absorption spectroscopy at atmospheric pressure

Cited by 83 publications

References 7 publications

EXAFS investigation on Sb incorporation effects to electrical transport in SnO2 thin films deposited by sol–gel

EXAFS investigation on Sb incorporation effects to electrical transport in SnO2 thin films deposited by sol–gel

Commissioning and first results of the LNLS XAFS beamline

Comparative Study of the Polarized XANES at the Cu K Edge of Bi2Sr2Ca1Cu2O8, Bi2Sr2Ca2Cu3O10, and Y1Ba2Cu3O7 Thin Films

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Comparative Study of the Polarized XANES at the Cu K Edge of Bi₂Sr₂Ca₁Cu₂O₈, Bi₂Sr₂Ca₂Cu₃O₁₀, and Y₁Ba₂Cu₃O₇ Thin Films