1994
DOI: 10.1103/physrevb.50.3266
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Electron tunneling and transport in the high-TcsuperconductorY1et al.

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Cited by 74 publications
(42 citation statements)
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“…Any kind of impurities produces in d-wave superconductors an effect analogous to pair-breaking by magnetic impurities in standard s-wave superconductors, leading to a rapid decrease of the critical temperature with increasing scattering rate, as measured for example by the residual resistivity. This is in contrast with some experiments showing a decrease of T c an order of magnitude slower than expected [5].…”
Section: Introductioncontrasting
confidence: 96%
“…Any kind of impurities produces in d-wave superconductors an effect analogous to pair-breaking by magnetic impurities in standard s-wave superconductors, leading to a rapid decrease of the critical temperature with increasing scattering rate, as measured for example by the residual resistivity. This is in contrast with some experiments showing a decrease of T c an order of magnitude slower than expected [5].…”
Section: Introductioncontrasting
confidence: 96%
“…This gives us greater control over the amount of damage in the weak link since T c suppression is controllable and reproducible for a variety of ion types and energies when the ions pass through the film. 18,19 Our devices resemble directly scribed electron beam junctions since both types of devices are interface free and operate at similar length scales. 20 Unlike the electron beam damaged devices that anneal at room temperature over a period of days or weeks, the ion beam damaged weak links show substantially greater stability at room temperature.…”
Section: Planar Thin Film Yba 2 Cu 3 O 7؊␦ Josephson Junctions Via Namentioning
confidence: 99%
“…Using TRIM code 12 and suitable assumptions, we have computed a gaussian-like distribution of defects centered on the 20 nm wide slit whose standard deviation is roughly 80 nm 13 , much smaller than a crude estimate of 150 nm or so 4 , and in good agreement with experimental observations : the normal state resistance measured corresponds to the expected width of the channel within a few percents, even for the 1 µm wide ones, confirming that the straggling is much smaller than this value ; based on the actual R(T) curve of a pristine channel, we have been able to compute the one of irradiated samples with a very good accuracy (Figure 3). The increase in resistivity and the decrease in T c as a function of the created defects have been taken from the literature 3,[14][15][16] . The resistance of the whole irradiated channel has been then calculated by integrating the resistivity over the defects distribution.…”
Section: /06/05mentioning
confidence: 99%