“…Although complex arrangements of dislocations are wellresolved by diffraction contrast techniques in transmission electron microscopy (TEM), particularly under weak-beam imaging conditions (Cockayne et al, 1969), information regarding feature height position is mostly lost in any single image since TEM is a projection technique. This challenge has motivated much interest in developing diffraction-contrast tomographic techniques suitable for dislocation imaging, as has been the subject of several recent reviews (Liu et al, 2014;Feng et al, 2020;Hata et al, 2020aHata et al, , 2020b. One widely employed approach, which was pioneered by co-workers (Barnard et al, 2006a, 2006b), is to apply intensity-based reconstruction algorithms, such as weighted back projection (WBP) or the sequential iterated reconstruction technique (SIRT), to diffraction contrast images collected over a wide tilt range but with finely spaced tilt increments.…”