Electron Temperature Dependence of Recombination of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msubsup><mml:mrow><mml:mi mathvariant="normal">Ne</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow><mml:mrow><mml:mo>+</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>Ions with Electrons

Mehr, F. J.; Biondi, Manfred A.

doi:10.1103/physrev.181.271

Cited by 37 publications

(7 citation statements)

References 14 publications

(4 reference statements)

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“…One needs to remember that in these first pioneering experiments many other factors, including impurities, may have contributed to the magnitude of the reported rate constants [8]. However, the rate constant for Ne 2 + is in reasonable agreement with more modern measurements [9]. Moved by the experimental results, another one page paper by Bates [10] gave an expression for the direct DR rate coefficient by writing it as the product of a capture rate constant and a probability for dissociation competing with autoionization.…”

Section: The Beginningmentioning

confidence: 60%

Comments on developments in the theory of dissociative recombination over the past 60 years

Guberman¹

2011

J. Phys.: Conf. Ser.

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Since the proposal, sixty years ago, of the direct dissociative recombination (DR) mechanism by Bates, there have been many important theoretical advances, especially within the past 30 years. Space limitations preclude the review of all significant theoretical contributions. Instead, I comment upon a few selected developments. Highlights of the early scattering theory of DR and of the powerful Multichannel Quantum Defect Theory (MQDT) are discussed. Enhancements to the latter approach have included the addition of second and all order K matrices, ion rotational motion, Rydberg states with excited cores and spin-orbit coupling between Rydberg states. Also discussed are DR by Born-Oppenheimer breakdown, angular product distributions in diatomic DR and oscillations in DR cross sections.

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Section: The Beginningmentioning

confidence: 60%

Comments on developments in the theory of dissociative recombination over the past 60 years

Guberman¹

2011

J. Phys.: Conf. Ser.

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“…It should be mentioned that a slight uncertainty must be assigned to Ea(r). This arises from the inaccuracy of a, due to the possibly not fully justifiable extrapolation of the data of PRILBRXCIZ et al [9].…”

Section: Numerical Resultsmentioning

confidence: 99%

“…We have assumed that this relationship may be extrapolated to electron temperatures as high as 40000 K. We then obtain [9] : cc = 2.5 10-8U;1'2 (cni3/s). I t is now possible to check whether the Ne+ density is negligible, as assumed previously.…”

Section: The Reaction and Diffusion Coefficientsmentioning

confidence: 98%

“…Processes ( l}, [ 2), (3), (4} and (9) are induced by electron collisions ; process (51, [ 61 and (8) are induced by collisions with neutral gas atoms.…”

Section: Basic Processesmentioning

confidence: 99%

“…(b) T h e volume r e c o m b i n a t i o n coefficient cc PHILBRICK et al have measured the volunie recombination coefficient of Se,+ ions with electrons for electron temperatures up to 6000 K. I n this region a is inversely proportional to T,1'2. We have assumed that this relationship may be extrapolated to electron temperatures as high as 40000 K. We then obtain [9] : cc = 2.5 10-8U;1'2 (cni3/s).…”

Section: The Reaction and Diffusion Coefficientsmentioning

confidence: 99%

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Model Calculations on the Positive Column of a Medium Pressure Neon Gas‐discharge

Smits

Lammers

Baghuis

et al. 1974

Contrib Plasma Phys

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SummaryXodel calculations on the positive column of a neon gas-discharge for gas pressures between 50 and 3.50 torr and currents between 5 and 100 mA are presented. In these calculations a Druyvesteyn distribution for the electron energy has been used. Volume recombination and radially dependent electron and gas temperatures have been taken into account. Numerical results are compared with available experimental data. In purticular, the axial field strength, electron density, electron temperature and ambipolar field strength are considered. I n general, the agreement between experimental a n d numerical data is good.

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The Dual Mode Microwave Afterglow Apparatus for Measuring the Electron Temperature Dependence of the Electron‐Ion Recombination

Mikuš

Morva

Morvová

et al. 2008

Contrib. Plasma Phys.

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Key words Stationary afterglow plasma, microwave diagnostics of plasma, electron heating with microwaves, dissociative recombination, electron temperature dependence of recombination, molecular neon ions. PACS 34. 80, 52.20, 52.70 Three dual mode microwave apparatus (one using S-band and two using X-band) have been developed to determine ambipolar diffusion and electron-ion recombination rates under conditions such that Tgas = 300K and Te is varied from 300 K to 6300 K, in the afterglow period of the dc glow discharge. The T M010 cylindrical cavity (in S-band) and T M011 open cylindrical cavity (X-band) are used to determine the electron density during the afterglow period and a non-resonant waveguide mode is used to apply a constant microwave heating field to the electrons. To test the properties of the apparatus the neon afterglow plasma has been investigated. At Te = 300 K a value of α(Ne (X-band) obeyed over the range 300 ≤ Te ≤ 6300K are in good agreement with some other previous measurements. The simplicity of the X-band microwave apparatus also allows the measurements of the gas temperature dependency and the study of electron attachment and may be used simultaneously with optical or mass spectrometry investigations.

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Electron Temperature Dependence of Recombination ofNe2+Ions with Electrons

Cited by 37 publications

References 14 publications

Comments on developments in the theory of dissociative recombination over the past 60 years

Comments on developments in the theory of dissociative recombination over the past 60 years

Model Calculations on the Positive Column of a Medium Pressure Neon Gas‐discharge

The Dual Mode Microwave Afterglow Apparatus for Measuring the Electron Temperature Dependence of the Electron‐Ion Recombination

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