Electron spectroscopy using two-dimensional electron detection and a camera in a single electron counting mode

Vos, Maarten; Went, Michael; Weigold, E.

doi:10.1063/1.3152366

Cited by 7 publications

(5 citation statements)

References 8 publications

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“…2͒ was described in detail in Ref. 20 Further the width of the entrance slit of the hemispherical analyzer ͑positioned after the slit lens͒ was reduced from 3 to 0.5 mm. Since then the readout of the twodimensional detector was changed from a resistive anode to a phosphor screen/camera.…”

Section: Methodsmentioning

confidence: 99%

Electron scattering at high momentum transfer from methane: Analysis of line shapes

Vos

2010

The Journal of Chemical Physics

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The measurement of the energy distribution of keV electrons backscattered elastically from molecules reveals one or more peaks. These peaks are at nonzero energy loss and have an intrinsic width. The usual interpretation of these measurements is attractively simple and assumes billiard-ball-type collisions between the electron and a specific atom in the molecule, and the scattering atom is assumed to behave as a free particle. The peak position is then related to the mass of the scattering atom, and its width is a Compton profile of the momentum distribution of this atom in the molecule. Here we explore the limits of the validity of this picture for the case of electrons scattering from methane. The biggest discrepancy is found for electrons scattering from carbon. For electrons scattering from hydrogen the effects are substantial at relatively low incoming energies and appear to decrease with increasing momentum transfer. The discrepancy is analyzed in terms of the force the atom experiences near the equilibrium position.

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Section: Methodsmentioning

confidence: 99%

Electron scattering at high momentum transfer from methane: Analysis of line shapes

Vos

2010

The Journal of Chemical Physics

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“…The original readout of the detector was based on a resistive anode. This has since been replaced by a phosphor screen-camera combination [13]. Together with several other small changes (reduced diameter of the gas needle, set of slits at the entrance of the hemispherical analyser) this has resulted in an improvement of the energy resolution of 0.6 eV (for a 300 nA beam) to 0.25-0.3 eV (for a 50 nA beam).…”

Section: Methodsmentioning

confidence: 99%

Electron scattering from Xe: the relation between the differential elastic cross section and shape and intensity of the energy loss spectra

Vos¹

2010

J. Phys. B: At. Mol. Opt. Phys.

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The measurement of the energy loss spectra of energetic electrons scattered from Xe over large angles is reported. The incoming energy was chosen between 600 eV and 1550 eV. The calculated Xe elastic scattering cross section has a sharp minimum for 750 eV electrons near 135°. This minimum is confirmed by studying a Xe–H2 mixture and separating their elastic peak based on the recoil effect. The energy loss part of the Xe spectra is rich in structure. Surprisingly the shape and intensity (relative to the elastic peak) changes dramatically if one approaches the scattering conditions for which the elastic cross section has a minimum. These observations are rationalized by describing the inelastic intensity semi-classically, as a consequence of a two-step process occurring at the same atom involving scattering from the nucleus and an electronic excitation. The change in shape of the loss spectra is attributed to a large increase in relative intensity of the dipole-forbidden transitions near sharp minima in the elastic cross section.

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“…10 and 11, however, nowadays the detector is read out using a camera, 12 rather than a resistive anode. Here, we summarize some main points relevant for this work.…”

Section: Methodsmentioning

confidence: 99%

A high-energy electron scattering study of the electronic structure and elemental composition of O-implanted Ta films used for the fabrication of memristor devices

Vos

Grande

Nandi

et al. 2013

Journal of Applied Physics

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High-energy electron scattering is used to investigate Ta films implanted with 10 keV O ions. These films are of interest as they have been used for the fabrication of memristors. High-energy electron scattering is used with incoming electron energies ranging from 5 to 40 keV. The inelastic mean free path, and hence the probing depth, is at these energies of the same order as the range of the implanted ions. At the same time, we can distinguish the mass of the atom that scattered the electron elastically, due to the dependence of the recoil energy on the mass of the scatterer. This allows us to determine quantitatively the atomic composition near the surface from the signal of electrons that have scattered elastically but not inelastically. Electrons that have scattered inelastically as well as elastically provide us with information on the possible electronic excitations. Their signal is used to monitor the presence of the Ta 2 O 5 phase near the surface (characterised by a significant band gap of ' 4:5 eV), and estimate at what depth below the surface pure Ta metal is present. In this way, we obtain a fairly detailed picture of the elemental composition and electronic properties of these films.

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Electron spectroscopy using two-dimensional electron detection and a camera in a single electron counting mode

Cited by 7 publications

References 8 publications

Electron scattering at high momentum transfer from methane: Analysis of line shapes

Electron scattering at high momentum transfer from methane: Analysis of line shapes

Electron scattering from Xe: the relation between the differential elastic cross section and shape and intensity of the energy loss spectra

A high-energy electron scattering study of the electronic structure and elemental composition of O-implanted Ta films used for the fabrication of memristor devices

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