Electron microscopy with high accuracy and precision at atomic resolution: <i>In-situ</i> observation of a dielectric crystal under electric field

Satô, Yukio; Gondo, Takashi; Miyazaki, Hiroya; Teranishi, Ryo; Kaneko, Kenji

doi:10.1063/1.4986361

Cited by 14 publications

(4 citation statements)

References 43 publications

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“…The obtained images were smoothened via radial Wiener filtering (HREM Research Inc.). The positions of the A-and B-site cations in the images were determined using the two-dimensional Gaussian fitting method 58 to calculate the displacements of the A-site cations relative to the centers of the unit cells formed of B-site cations.…”

Section: Methodsmentioning

confidence: 99%

Piezoelectricity in perovskite-type pseudo-cubic ferroelectrics by partial ordering of off-centered cations

et al. 2020

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A large piezoelectric response in ferroelectric ceramics is typically associated with extrinsic contributions from ferroelectric domain structures. However, such domain structures cannot be expected in systems with pseudo-cubic symmetry. In this study, we determine the mechanism of significant piezoelectricity and ferroelectricity in 0.3BaTiO3–0.1Bi(Mg1/2Ti1/2)O3–0.6BiFeO3 ceramic with a perovskite-type pseudo-cubic symmetry. Synchrotron radiation X-ray diffraction reveals that the Bi ions in this ceramic essentially prefer to be off-centered at six sites by approximately 0.4 Å, in the cubic <100> directions. A phase transition occurs at TC ~725 K. However, the crystal seems to present a cubic symmetry even at room temperature. The large piezoelectric response is caused by the combinational partial ordering of the off-centered Bi ions, adapted to any direction of the applied electric field to the ceramic grains. The proposed mechanism for the emergence of a high polarization in the above system will enable designing novel Pb-free ceramics by controlling the fluctuated and off-centered ions under an applied electric field.

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Section: Methodsmentioning

confidence: 99%

Piezoelectricity in perovskite-type pseudo-cubic ferroelectrics by partial ordering of off-centered cations

et al. 2020

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“…For instance, for the 200 nm-thick GIS-deposited Pt and C pathways in the empty MEMS-based chip (no lamella ) shown in Fig. S2 , parasitic currents in the range of 10 −5 A were measured between the inner and outer electrodes at an applied dc bias of 0.1 V. Similarly, the leakage current values reported for two-terminal thin-film metal-insulator-metal (MIM) TEM lamella devices range from 10 −5 to 10 −2 A at 0.1 V 7 – 10 , 14 , 16 – 18 (Figs. S3 and S4 ).…”

Section: Introductionmentioning

confidence: 83%

Operando two-terminal devices inside a transmission electron microscope

Recalde-Benitez,

Jiang,

Winkler

et al. 2023

Commun Eng

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Advanced nanomaterials are at the core of innovation for the microelectronics industry. Designing, characterizing, and testing two-terminal devices, such as metal-insulator-metal structures, is key to improving material stack design and integration. Electrical biasing within in situ transmission electron microscopy using MEMS-based platforms is a promising technique for nano-characterization under operando conditions. However, conventional focused ion beam sample preparation can introduce parasitic current paths, limiting device performance and leading to overestimated electrical responses. Here we demonstrate connectivity of TEM lamella devices obtained from a novel electrical contacting method based solely on van der Waals forces. This method reduces parasitic leakage currents by at least five orders of magnitude relative to reported preparation approaches. Our methodology enables operation of stack devices inside a microscope with device currents as low as 10 pA. We apply this approach to observe in situ biasing-induced defect formation, providing valuable insights into the behavior of an SrTiO3-based memristor.

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“…A‐site (Bi/Ba) and B‐site (Fe/Ti) ion column positions were determined using a 2D Gaussian fitting method. [ 62 ] Image distortions due to specimen drift and a scanning microscope system were corrected using a two‐step affine transformation method, [ 63,64 ] and the measured lattice parameter was observed to be up to ≈0.11% accurate. A‐site ion off‐centering was calculated as the deviation from the center of the B‐site ion sub‐lattice.…”

Section: Methodsmentioning

confidence: 99%

Piezoelectric Actuation Mechanism Involving Extrinsic Nanodomain Dynamics in Lead‐Free Piezoelectrics

et al. 2023

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Piezoelectric materials play a key role in applications, while there are physically open questions. The physical origin of piezoelectricity is understood as the sum of contributions from intrinsic effects on lattice dynamics and those from extrinsic effects on ferroic‐domain dynamics, but there is an incomplete understanding that all but intrinsic effects are classified as extrinsic effects. Therefore, the accurate classification of extrinsic effects is important for understanding the physical origin of piezoelectricity. In this work, high‐energy synchrotron radiation X‐ray diffraction is utilized to measure the response of BiFeO3−BaTiO3 piezoelectrics and the intrinsic/extrinsic contribution to electric fields. It is found from crystal structure and intrinsic/extrinsic contribution, using the analysis involving structure refinement with various structural model and micromechanics‐based calculations, that Bi3+‐ion disordering is important for realization of piezoelectricity and nanodomains. Here, an extrinsic effect on the rearrangement of nanodomains is suggested. The nanodomains, which are formed by the locally distorted structure around the A‐site by Bi‐ion disordering, can significantly deform the material in the BiFeO3−BaTiO3 system, which contributes to the piezoelectric actuation mechanism apart from the extrinsic effect on ferroic‐domain dynamics. Bi‐ion disordering plays an important role in realizing piezoelectricity and nanodomains and can provide essential material design clues to develop next‐generation Bi‐based lead‐free piezoelectric ceramics.

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Electron microscopy with high accuracy and precision at atomic resolution: In-situ observation of a dielectric crystal under electric field

Cited by 14 publications

References 43 publications

Piezoelectricity in perovskite-type pseudo-cubic ferroelectrics by partial ordering of off-centered cations

Piezoelectricity in perovskite-type pseudo-cubic ferroelectrics by partial ordering of off-centered cations

Operando two-terminal devices inside a transmission electron microscope

Piezoelectric Actuation Mechanism Involving Extrinsic Nanodomain Dynamics in Lead‐Free Piezoelectrics

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