Electron microscopy study of Mn/Sb multilayered films with an artificial superstructure

Nakayama, Noriaki; Moritani, Isao; Shinjo, Teruya; Ishizaki, A.; Hajimoto, K.

doi:10.1080/01418618908229784

Cited by 12 publications

(7 citation statements)

References 10 publications

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“…The non-stoichiometric intermetallic compound Mnl+,Sb has a NiAs-type structure (P6,/mmc) with lattice dimensions of a = 4.128 A and c = 5.787 A for x = 0.02 [17]. Lattice parameters of the 143 A thick epitaxial MnSb layer are close to those of nearly stoichiometric MnSb [4]. The orientational relationship of the epitaxy was found to be (Oo.l),b11(00.1)M"Sb; [11.0],,11 [11.O],,sb in the previous x-ray diffraction and electron microscopy study [4].…”

Section: Structural Aspect Of Mn/sb Multilayered Filmsmentioning

confidence: 94%

“…Electron microscopy is also a powerful tool for the structural characterization, especially on the local structures, although it is a destructive method. The results of electron microscopy on a sample containing monolayer-thick MnSb have been published elsewhere [4]. They revealed the formation of a coherent multilayered structure.…”

Section: Introductionmentioning

confidence: 92%

“…The interfacial reaction occurs even when the substrate temperature is kept at room temperature. A Mn layer 40 A thick in a Sb(300 A)/Mn(40 A)/Sb(100 A) sandwiched film has been found to turn to a MnSb film 143 A thick epitaxially grown between Sb layers [4]. The non-stoichiometric intermetallic compound Mnl+,Sb has a NiAs-type structure (P6,/mmc) with lattice dimensions of a = 4.128 A and c = 5.787 A for x = 0.02 [17].…”

Section: Structural Aspect Of Mn/sb Multilayered Filmsmentioning

confidence: 99%

“…Epitaxial superlattice films have been prepared for various combinations of metals [ 11. Most of them are those where the two constituents have the same crystal structure and nearly equal lattice parameters. Recently, the authors have investigated multilayered filmscomposedof Mn and Sb with different crystalstructures [2][3][4]. Epitaxial superlattice films are obtained when Mn layers one or two monolayers thick are sandwiched by Sb layers 50 A thick.…”

Section: Introductionmentioning

confidence: 99%

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X-ray diffraction study of Mn/Sb multilayered films with artificial superstructures

Moritani¹,

Nakayama²,

Shinjo³

1990

J. Phys.: Condens. Matter

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Structures of Mn/Sb multilayered films have been investigated by X-ray diffraction. MnSb/Sb superlattice films are obtained when the nominal thicknesses are (Mn(1 AA)/Sb(50 AA))90 and (Mn(2 AA)/Sb(50 AA))90. Ultrathin layers of MnSb are formed by interfacial reaction in these samples with keeping an epitaxial orientation of (00.1)MnSb//(00.1)Sb; (11.0)MnSb//(11.0)Sb. These films have fibre texture structures with an in-plane coherence length of about 300 AA. The distribution of growth orientation is approximated by a Gaussian distribution function with a half-width of about 10 degrees . The analyses of diffraction intensities indicate that (i) the texture structure causes a monotonic reduction of peak intensity with increase of scattering vector including fundamental reflection and (ii) that layer thickness fluctuations in the range of one or two monolayers cause peak broadening and intensity reduction only for the higher-order satellite reflections. Observed satellite intensities could be reproduced by a model calculation which takes into consideration these two effects.

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Section: Structural Aspect Of Mn/sb Multilayered Filmsmentioning

confidence: 94%

Section: Introductionmentioning

confidence: 92%

Section: Structural Aspect Of Mn/sb Multilayered Filmsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

X-ray diffraction study of Mn/Sb multilayered films with artificial superstructures

Moritani¹,

Nakayama²,

Shinjo³

1990

J. Phys.: Condens. Matter

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show abstract

“…High-resolution cross sectional TEM images show a good structural coherence between adjacent Sb layers: some atomic steps are observed in MnSb layers, perfectly flat monolayers extend over about 50 a (Ref. [5]).…”

Section: Sample Preparation a N D Characterizationmentioning

confidence: 97%