Electron Ionization of Dimethylphenylsilane – Appearance Energies of Selected Ionic Fragments

Abstract

Electron ionization (EI) to dimethylphenylsilane (DMPS) is studied in crossed electron‐molecular beams experiment. Using this technique with improved energy resolution of the electron beam, the positive mass spectra and the relative partial cross sections for EI to DMPS are obtained. The ionization energy of DMPS of 9.04 ± 0.06 eV and the threshold energies for dissociative ionization channels are estimated. The bond dissociation energies for single bond cleavage channels are also estimated on the basis of experimental observations. The detection of doubly charged ions of DMPS2+ (AE = 26.3 ± 1 eV) as well as several other doubly charged fragments is discussed in detail.

Fragmentation of methylphenylsilane and trimethylphenylsilane: A combined theoretical and experimental study

“…They reflect the composition of a molecule and give us an overview of the fragmentation products. The remaining mass spectrum of DMPS was taken from the work of Kočišek et al [22], which was measured using similar methodology.…”

“…A frequent aspect observed Table 4 The appearance energies and bond dissociation energies of selected positive ions for dimethylphenylsilane determined from experiment and calculated using the theory from B3LYP/6-311++G(d,p) level. From dissociation energies published in [22], we have derived bond dissociation energies. in the mass spectra is an elimination of H 2 as is observed several times in the spectra of MPS and DMPS.…”

“…Some aspects of their fragmentation process are presented in literature. The fragmentation mechanism of the DMPS molecule shown by Scheme 1 was proposed [22].…”

“…Some of the parameters (i.e. appearance energy, ionization energy) and mass spectra were presented in literature [22][23][24][25].…”