2005
DOI: 10.1016/j.susc.2005.06.096
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Electron-ion/atom coincidence measurements of 3keV He+ interacting with a SiH(100)-(2×1) surface

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Cited by 2 publications
(2 citation statements)
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“…The three basic advantages of using low-energy ion blocking to quantitatively determine a chemisorption site are as follows: ͑i͒ No prerequisite knowledge of the actual shapes of the blocking cones is required; ͑ii͒ accurate values of are not necessary since only normalized yields rather than absolute yields are needed; and ͑iii͒ the positions of the adsorbed atoms can be derived unambiguously by a triangulation procedure using incident angle scans with proper large scattering angles. The spectral interpretation, as described elsewhere, [17][18][19] is facilitated by use of ͑i͒ the simulation program SARIC, 18 which is based on the classical theory of ion scattering using a binary collision approximation ͑BCA͒, and ͑ii͒ "two-atom" molecular dynamics ͑MD͒ simulations. 20 All measurements were carried out at room temperature in a TOF-SARS spectrometer that has been described in detail elsewhere.…”
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confidence: 99%
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“…The three basic advantages of using low-energy ion blocking to quantitatively determine a chemisorption site are as follows: ͑i͒ No prerequisite knowledge of the actual shapes of the blocking cones is required; ͑ii͒ accurate values of are not necessary since only normalized yields rather than absolute yields are needed; and ͑iii͒ the positions of the adsorbed atoms can be derived unambiguously by a triangulation procedure using incident angle scans with proper large scattering angles. The spectral interpretation, as described elsewhere, [17][18][19] is facilitated by use of ͑i͒ the simulation program SARIC, 18 which is based on the classical theory of ion scattering using a binary collision approximation ͑BCA͒, and ͑ii͒ "two-atom" molecular dynamics ͑MD͒ simulations. 20 All measurements were carried out at room temperature in a TOF-SARS spectrometer that has been described in detail elsewhere.…”
mentioning
confidence: 99%
“…Ion fractions were determined by measuring the TOF spectra with and without a voltage applied to the deflection plates. 18 The sample was mounted on a conventional manipulator that provided reproducible rotation in both the azimuthal and incident angles within ±0.5°. The temperature of the sample was measured by a calibrated infrared pyrometer and a thermocouple attached to the front edge of the sample surface.…”
mentioning
confidence: 99%