Electron induced SEU and MBU sensitivity of 20-nm planar and 16-nm FinFET SRAM-based FPGA

Augustin, G.; Mauguet, M.; Andrianjohany, N.; Sukhaseum, N.; Chatry, N.; Bezerra, F.

doi:10.1109/radecs50773.2020.9857681

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2020

DOI: 10.1109/radecs50773.2020.9857681

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Electron induced SEU and MBU sensitivity of 20-nm planar and 16-nm FinFET SRAM-based FPGA

G. Augustin

M. Mauguet

N. Andrianjohany

et al.

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Electron induced SEU and MBU sensitivity of 20-nm planar and 16-nm FinFET SRAM-based FPGA

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References 18 publications

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