Electron Holography Study of Secondary Electron Distribution around Charged Epoxy Resin

Abstract

The accumulation and distribution of electron-induced secondary electrons around epoxy resin are studied using electron holography. The distribution of secondary electrons is determined to be sensitive to the surface conditions of the epoxy resin, particularly to the presence of conductive materials on the surface that are introduced during specimen preparation processes. These results provide a deeper understanding of the charging and discharging mechanisms for epoxy resin, and the behavior of secondary electrons around these materials. This study also provides a new perspective for the visualization of various forms of electron behavior around insulating materials such as epoxy resin through the control of their surface characteristics.

Advanced Electron Microscopy for Materials Science

“…Sato et al 19) studied the distribution of secondary electrons around a charged epoxy film prepared by ultramicrotomy. Figure 4(a) shows a reconstructed phase image of a thin film of epoxy resin (dark-brown region).…”

“…This special issue contains a total of five articles covering research on the wave behavior of electrons 16,17) and analyses of materials and devices using electron holography. 18,19) In addition to electron holography, various techniques such as dark-field imaging and high-angle annular dark-field (HAADF) STEM observations have been used to characterize charged-domain walls (CDWs) in ferroelectric materials. 20) Furthermore, extensive TEM-based analyses have recently been published.…”

Electron holography observation of electron spin polarization around charged insulating wire

“…The accumulation and distribution of secondary electrons around the surfaces of various insulators such as epoxy resin [ 33 ] and ferroelectric BaTiO 3 and cellulose nanofibers [ 15 ] have also been investigated. In addition, the energy distribution of secondary electrons has been estimated using a secondary electron analyzer developed for a 300-kV transmission electron microscope [ 34 ].…”