Electron field emission from various morphologies of fluorinated amorphous carbon nanostructures

Lai, Shih-Hsiang; Chang, Kai-Chun; Shih, Han C.; Huang, Kuo-Jung; Lin, Pang

doi:10.1063/1.1828595

Cited by 37 publications

(10 citation statements)

References 25 publications

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“…In the presented work, we investigated field-emission properties of nanoporous carbon (NPC) [27][28][29][30][31][32][33][34]-one of all-carbon materials with disordered nanoscale structure. Due to developed pore/skeleton interface, homogeneity of pore size, strong adsorption ability, relatively high electric conductivity, and mechanical strength, the NPC materials give considerable promise for diverse applications, including manufacture of field electron emitters [35] for microwave, light, and X-ray sources, plasma devices, space thrusters, and microelectronic components and gauges.…”

Section: Introductionmentioning

confidence: 99%

Field‐Induced Electron Emission from Nanoporous Carbons

Архипов

Davydov

Gabdullin

et al. 2014

Journal of Nanomaterials

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Influence of fabrication technology on field electron emission properties of nanoporous carbon (NPC) was investigated. Samples of NPC derived from different carbides via chlorination at different temperatures demonstrated similar low-field emission ability with threshold electric field 2-3 V/μm. This property correlated with presence of nanopores with characteristic size 0.5–1.2 nm, determining high values of specific surface area (>800 m2/g) of the material. In most cases, current characteristics of emission were approximately linear in Fowler-Nordheim coordinates (excluding a low-current part near the emission threshold), but the plots’ slope angles were in notable disagreement with the known material morphology and electronic properties, unexplainable within the frames of the classical emission theory. We suggest that the actual emission mechanism for NPC involves generation of hot electrons at internal boundaries and that emission centers may be associated with relatively large (20–100 nm) onion-like particles observed in many microscopic images. Such particles can serve two functions: to provide additional “internal” enhancement of the electric field and to inhibit relaxation of hot charge carriers due to the “phonon bottleneck” effect.

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Section: Introductionmentioning

confidence: 99%

Field‐Induced Electron Emission from Nanoporous Carbons

Архипов

Davydov

Gabdullin

et al. 2014

Journal of Nanomaterials

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“…It is known that Teflon is produced during CF 4 plasma treatments, 13,14 as such a layer apparently lowers the work function of the coated material. 14,15 We note that the island is placed at distances of 12 and 26 nm toward source and drain, respectively (see Figure 1b). The gating electrode is placed at a slightly larger distance away of 35 nm.…”

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confidence: 96%

Coulomb-Controlled Single Electron Field Emission via a Freely Suspended Metallic Island

2010

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We observe Coulomb blockade in the field-emission current of a metallic island between two electrodes freely suspended by thin tunneling barriers. A third electrode serves as a gating contact to trace the Coulomb staircase of the device. Coulomb blockade is revealed at 77 K in conjunction with field emission. The measurements are in very good agreement with a theoretical model, taking into account orthodox Coulomb blockade and field emission.

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“…In addition, according to the FN plot, the slope m [given in eq. ( 1)] would represent the combined effect of work function and enhancement of local electric field () and is given by m ¼ ÀðB 3=2 Þ=, using ¼ 4:7 eV for the work function of DLC, 21,22) the field enhancement factor was calculated from the slope of the F-N plot. The enhancement factors are 3:5 Â 10 4 and 1:9 Â 10 4 , respectively for the films prepared at TMS flow 20 and 15 sccm, respectively.…”

Section: Resultsmentioning

confidence: 99%

Electron Field Emission of Silicon-Doped Diamond-Like Carbon Thin Films

Ray

Ghosh

Chiguvare

et al. 2010

Jpn. J. Appl. Phys.

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In this work we demonstrate that the field emission characteristics of disordered Si-doped diamond-like carbon (DLC) thin films depend not only on properties of the conductive clustered sp 2 phase and the insulating sp 3 matrix (or sp 2 /sp 3 ratio) but also on the presence of Si-H n and C-H n species in the film. The presence of such species reduces the hardness of the film and simultaneously enhances the field emission performance. A turn on electric field (E TOF) of 6.76 V/mm produced a field emission current density of 0:2 mA/cm 2 , when an electric field of 20 V/mm was applied. The Fowler-Nordheim (FN) tunneling model is appropriate to explain the field emission mechanism only within limited range of the current density. However, it is found that there is an apparent crossover between space charge limited current (SCLC) and the Frenkel effect due to impurities incorporated during the fabrication of Si-DLC films. This combined effect (SCLC + Frenkel) allows for the emission of electrons from the top of the reduced barriers due to the formation of comparatively soft DLC:Si films. The emission also occurs through tunneling from one conductive cluster (sp 2 C=C) to another separated by an insulating matrix (sp 3 CC) after reducing the effective depth of a trap on application of high electric field.

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Electron field emission from various morphologies of fluorinated amorphous carbon nanostructures

Cited by 37 publications

References 25 publications

Field‐Induced Electron Emission from Nanoporous Carbons

Field‐Induced Electron Emission from Nanoporous Carbons

Coulomb-Controlled Single Electron Field Emission via a Freely Suspended Metallic Island

Electron Field Emission of Silicon-Doped Diamond-Like Carbon Thin Films

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